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題名:A Method Based on Patent Analysis for Nanotechnoloby Using the Patent Map
書刊名:東南學報
作者:劉振源謝澄漢羅勝益
作者(外文):Liu, C-YShieh, C-HLuo, S-Y
出版日期:2006
卷期:30
頁次:頁45-53
主題關鍵詞:Patent mapIPCInternational patent classificationJapanese patent informationFIFile indexClassificationF-terms classificationTheme code專利地圖奈米科技專利分析
原始連結:連回原系統網址new window
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  • 被引用次數被引用次數:期刊(0) 博士論文(0) 專書(0) 專書論文(0)
  • 排除自我引用排除自我引用:0
  • 共同引用共同引用:0
  • 點閱點閱:35
摘 要 本論文提供一種簡易且有效之方法,以發展創新諸如奈米科技之特定領域之技術。 由日本特許廳所開發之FI 及F-term 分類系統,在研究或檢索日本專利文件上,自不同 於泛用之國際專利分類系統,除可避免曠日費時的專利檢索之過程,並能提昇其檢索之 精確度,因此,本論文藉由JPO 系統並透過兩維構成之F-term 架構,施行term code 布 林邏輯運算而建立技術矩陣圖。其結果,特定領域之奈米碳管製造技術得以完整呈現。
Abstract The paper supplies an easy and effective methodology to develop a nanotechnology from Japanese patent information. Using the File Index (FI) and F-term classification system by Japan Patent Office (JPO) searched or researched the Japanese patent documents. Moreover, the paper used carbon nanotube an example to establish a specific technological matrix from the two-dimension structure of the F-term list in the theme code of the JPO system through Boolean logical operations. The resulting particular technical fields as carbon nanotube were developed to improve or enhance the current technological capability.
期刊論文
1.Yoon, B.、Park, Y.(2005)。A Systematic Approach for Identifying Technology Opportunities: Keyword-based Morphology Analysis。Technological Forecasting and Social Change,72(2),145-160。  new window
2.Abraham, B. P.、Moitra, S. D.(2001)。Innovation assessment through patent analysis。Technovation,21(4),245-252。  new window
3.Mogee, Mary Ellen(1991)。Using patent data for technology analysis and planning。Research-Technology Management,34(4),43-49。  new window
4.Mann, Darrell L.(2003)。Better technology forecasting using systematic innovation methods。Technological Forecasting & Social Change,70(8),779-795。  new window
5.Gupta, V. K.、Pangannaya, N. B.(2000)。Carbon nanotube: bibliometric analysis of patents。World Patent Inf,22,185-189。  new window
6.Dou, H. J. M.(2004)。Benchmarking R&D and companies through patent analysis using free databases and special software: a tool to improve innovative thinking。World Patent Inf,26,297-309。  new window
7.Schellner, I.(2001)。Sources of Japanese patent informatio。World Patent Inf,23(2),149-156。  new window
8.Morris, S.、DeYong, C.、Wu, Z.、Salman, S.、Yemenu, D.(2002)。DIVA: A Visualization System for Exploring Documents Databases for Technology Forecasting。Computers & Industrial Engineering,43(4),841-862。  new window
9.Schellner, I.(2002)。Japanese file index classification and F-Terms。World Patent Information,24(3),197-201。  new window
圖書
1.Glenn, Jerome C.、Gordon, Theodore J.(2003)。Futures research methodology。New York。  new window
 
 
 
 
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