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題名：指數加權移動平均管制法在幾何卜瓦松製程中之品管設計與使用
書刊名：品質學報
作者：陳慶文 引用關係／吳一聲／蘇國瑋 引用關係
作者(外文)：Chen, Ching-wen／Wu, Yi-sheng／Su, Kuo-wei
出版日期：2006
卷期：13:1
頁次：頁85-97
主題關鍵詞：幾何卜瓦松；指數加權移動平均；平均連串長度；馬可夫鏈；Geometric Poisson；Exponentially weighted moving average；EWMA；Average run length；ARL；Markov chain
原始連結：連回原系統網址new window
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  • 被引用次數被引用次數:期刊(0) 博士論文(0) 專書(0) 專書論文(0)
  • 排除自我引用排除自我引用:0
  • 共同引用共同引用:0
  • 點閱點閱:22
期刊論文
1.Borror, C. M.、Champ, C. W.、Rigdon, S. E.(1998)。Poisson EWMA control charts。Journal of Quality Technology，30(4)，352-361。  new window
2.陳慶文(20010600)。實驗貝氏分析在幾何卜瓦松製程品質管制上之應用。品質學報，8(1)，107-131。new window  延伸查詢new window
3.Champ, C. W.、Rigdon, S. E.(1991)。A comparison of the Markov chain and the integral equation approaches for evaluating the run length distribution of quality control charts。Communication in Statistics--Computation and Simulation，20，191-204。  new window
4.Chen, C. W.、Randolph, P. H.、Liou, T. S.(2005)。Using CUSUM control schemes for monitoring quality levels in compound Poisson production environment: the geometric Poisson process。Quality Engineering，17(2)，207-217。  new window
5.Friedman, D. J.、Albin, S. L.(1991)。Clustered defects in IC fabrication: impact on process control charts。IEEE Transactions on Semiconductor Manufacturing，4(1)，36-42。  new window
6.Fu, J. C.、Spiringa, F. A.、Xie, H.(2002)。On the average run lengths of quality control schemes using a Markov chain approach。Statistics & Probability Letters，56，369-380。  new window
7.Gan, F. F.(1990)。Monitoring Poisson observations using modified exponentially weighted moving average control charts。Communications in Statistics--Simulation and Computation，19，103-124。  new window
8.Jackson, E. J.(1972)。All Count Distributions Are Not Alike。Journal of Quality Technology，4(2)，86-92。  new window
9.Randolph, H. P.、Sahinoglu, M.(1995)。A stopping rule for a compound Poisson random variable。Applied Stochastic Models and Data Analysis，11，135-143。  new window
10.Roberts, S. W.(1959)。Control charts based on geometric moving average。Technometrics，1，234-250。  new window
11.Sheaffer, R. L.、Leavenworth, R. S.(1976)。The negative binomial model for counts in units of varying size。Journal of Quality Technology，8(3)，158-163。  new window
12.Stapper, C. H.(1985)。The Effects of Wafer to Wafer Defect Density Variations on Integrated Circuit Defect and Fault Distributions。IBM Journal of Research Development，29(1)，87-97。  new window
13.Albin, S. L.、Friedman, D. J.(1989)。The impact of clustered defect distributions in ic fabrication。Management Sciences，35(9)，1066-1078。  new window
14.Brook, D.、Evans, D. A.(1972)。An approach to the probability distribution of CUSUM run length。Biometrika，59(3)，539-549。  new window
15.Hunter, J. S.(1986)。The exponentially weighted moving average。Journal of Quality Technology，18(4)，203-219。  new window
16.Lucas, J. M.、Crosier, R. B.(1990)。Exponentially weighted moving average control schemes: properties and enhancements。Technometrics，32，1-12。  new window
17.Crowder, Stephen V.(1989)。Design of exponentially weighted moving average schemes。Journal of Quality Technology，21，155-162。  new window
18.Page, E. S.(1954)。Continuous inspection schemes。Biometrika，41(1/2)，100-115。  new window
學位論文
1.Gardiner, J. S.(1987)。Detecting small shifts in quality levels in a near-zero defect environment for integrated circuits(博士論文)。University of Washington，Seattle, Washington。  new window
圖書
1.Johnson, N. L.、Kotz, S.(1969)。Discrete Distribution。Boston, MA：Houghton Mifflin Company。  new window
2.Montgomery, D. C.(1996)。Introduction to Statistical Quality Control。New York, NY：John Wiley & Sons, Inc.。  new window
3.Parzen, E.(1962)。Stochastic Processes。San Francisco, CA：Holden-Day。  new window
4.Sherbrooke, C. C.(1966)。Discrete compound poisson processes and tables of the geometric poisson distribution。Santa Monica, CA：The Rand Corporation。  new window
5.Ross, S. M.(1993)。Introduction to Probability Models。Academic Press, Inc.。  new window
6.Ross, S. M.(1996)。Stochastic Processes。New York, NY：John Wiley & Sons。  new window
7.Shewhart, W. A.(1931)。Economic Control of Quality of Manufactured Product。New York：Bell Telephone Laboratories, Inc.。  new window
 
 
 
 
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