| 期刊論文1. | Wright, Benjamin、Panchapakesan, Nargis(1969)。A Procedure for Sample-Free Item Analysis。Educational and Psychological Measurement,29(1),23-48。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 2. | Lord, F. M.(1953)。The Relation of Test Score to the Trait Underlying the Test。Educational and Psychological Measurement,13,517-548。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 3. | Masters, G. N.(1982)。A Rasch model for partial credit scoring。Psychometrika,47(2),149-174。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 研究報告1. | 張武昌、周中天、陳純音、葉錫南、林正昌、許月貴(2003)。國民中學學生基本學力測驗英語雙峰現象暨改進措施(教育部專案研究)。 延伸查詢![new window](/gs32/images/newin.png) | 圖書1. | Birnbaum, A.(1968)。Some latent trait models and their user in inferring an examinee’s ability。Statistical theories of mental rest scores。Reading, MA:Addison-Wesley。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 2. | Wright, B. D.、Masters, G. N.(1982)。Rating scale analysis: Rasch measurement。Chicago:MESA Press。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 3. | Wright, B. D.、Stone, M. H.(1979)。Best Test Design: Rasch Measurement。Chicago, IL:Mesa Press。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 4. | Bond, T. G.,、Fox, C. M.(2000)。Applying the Rasch model: Fundamental measurement in the human sciences。Mahwah, NJ。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 5. | Linacre, J. M.(2004)。WINSTEPS Rasch measurement computer program。Chicago, IL。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 6. | Rasch, G.(1960)。Probabilistic models for some intelligent and attainment test。Copenhagen:Institute of Educational Research。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 其他1. | Zimoswski, M. F.,Muraki, E.,Mislevy, R. J.,,Bock, R. D.(1996)。BILOG-MG:Multiple-group IRT analysis and test maintenance for binary items [Computer software],Chicago,IL。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | |