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引文資料
題名:
Fast and Accurate Recognition of Control Chart Patterns Using a Time Delay Neural Network
書刊名:
工業工程學刊
作者:
顧瑞祥
/
薛友仁
作者(外文):
Guh, Ruey-shiang
/
Shiue, Yeou-ren
出版日期:
2010
卷期:
27:1
頁次:
頁61-79
主題關鍵詞:
時間延遲神經網路
;
形狀辨識
;
管制圖
;
統計製程管制
;
Time delay neural network
;
Pattern recognition
;
Control chart
;
Statistical process control
原始連結:
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相關次數:
被引用次數:期刊(
1
) 博士論文(0) 專書(0) 專書論文(0)
排除自我引用:0
共同引用:0
點閱:39
Pattern recognition is a critical issue in statistical process control because unnatural patterns displayed by control charts can be associated with specific causes that adversely impact on the manufacturing process. Recently, neural networks have been widely investigated as an effective approach to control chart pattern (CCP) recognition. However, most of the research in this field has used traditional back propagation networks (BPNs) that cannot deal with patterns that vary over time in an online CCP recognition scheme. This causes a pattern misclassification problem in nearly all neural network-based studies in the field of online CCP recognition. The present article presents a novel application of utilizing a time delay neural network (TDNN)-based model to address this problem. The TDNN, with its special architecture, can represent relationships between patterns in a time sequence, and is, therefore, suitable to be trained with dynamic patterns that change over time. Numerical results indicate that the pattern misclassification problem has been addressed effectively by the proposed TDNN-based model. When compared with traditional BPNs, the TDNN model has better performance in both recognition accuracy and speed. In comparison with traditional control chart approaches, the proposed model is capable of superior performance of average run length, while the category of the unnatural CCP can also be accurately identified.
以文找文
期刊論文
1.
Guh, R. S.(2007)。On-line identification and quantification of mean shifts in bivariate processes using a neural network-based approach。Quality and Reliability Engineering International,23(3),367-385。
2.
Cheng, C.-S(1997)。A neural network approach for the analysis of control chart patterns。International Journal of Production Research,35(3),667-697。
3.
Cheng, C. S.、Hubele, N. F.(1996)。A pattern recognition algorithm for an x-bar control chart。IIE Transactions,28(3),215-224。
4.
Nelson, L. S.(1984)。The Shewhart control chart--tests for special causes。Journal of Quality Technology,16,237-239。
5.
Nelson, L. S.(1985)。Interpreting Shewhart X-bar Control Charts。Journal of Quality Technology,17,114-116。
6.
Lucas, J. M.(1982)。Combined Shewhart-CUSUM quality control schemes。Journal of Quality Technology,14(2),51-59。
圖書
1.
Duncan, A. J.(1986)。Quality Control and Industrial Statistics。Homewood, Illinois:Richard D. Irown Inc.。
2.
Western Electric Company(1958)。Statistical Quality Control Handbook。Western Electric Company。
3.
Montgomery, D. C.(2009)。Statistical Quality Control。New York:John Wiley & Sons。
其他
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Alwan, L. C. ; Robert, H. V.(1995)。The problem of misplaced control limits。
2.
Arkat, J. S. ; Niaki, T. A. ; Abbasi, B.(2007)。Artificial neural networks in applying MCUSUM residuals charts for AR(1) processes。
3.
Barai, S. V. ; Pandey, P.(1997)。Time-delay neural networks in damage detection of railway bridges。
4.
Davis, R. B. ; Woodall, W. H.(1988)。Performance of the control chart trend rule under linear shift。
5.
Fukushima, K. ; Miyake, S.(1983)。Neocognitron: a neural network model for a mechanism of visual pattern recognition。
6.
Gan, F. F.(1992)。CUSUM control charts under linear drift。
7.
Grant, E. L. ; Leavenworth, R. S.(1996)。Statistical Quality Control。
8.
Guh, R. S.(2002)。Robustness of the neural network based control chart pattern recognition system to nonnormality。
9.
Guh, R. S.(2004)。Optimizing feedforward neural networks for control chart pattern recognition through genetic algorithms。
10.
Guh, R. S.(2008)。Real-time recognition of control chart patterns in autocorrelated processes using a learning vector quantization network-based approach。
11.
Guh, R. S. ; Shiue, Y. R.(2005)。On-line identification of control chart pattern using self-organizing approach。
12.
Ho, E. S. ; Chang, S. I.(1999)。An integrated neural network approach for simultaneous monitoring of process mean and variance shifts-a comparative study。
13.
Law, A. M. ; Kelton, W. D.(1982)。Simulation Modelling and Analysis。
14.
Lin, D. T.(2004)。Target components discrimination using adaptive time-delay neural network。
15.
Lucy-Bouler, T. L.(1991)。Using Autocorrelations, CUSUMs and Runs Rules for Control Chart Pattern Recognition: an Expert System Approach。
16.
Lucy-Bouler, T. L.(1993)。Application to forecasting of neural network recognition of shifts and trends in quality control data。
17.
NeuralWare(2001)。NeuralWorks Professional II/Plus Reference Guide。
18.
Niaki, S. T .A. ; Abbasi, B.(2008)。Detection and classification mean-shifts in multi-attribute processes by artificial neural networks。
19.
Pearlmutter, B. A.(1989)。Learning state space trajectories in recurrent neural networks。
20.
Swift, J. A. ; Mize, J. H.(1995)。Out-of-control pattern recognition and analysis for quality control charts using lisp-based systems。
21.
Wang, T. Y. ; Chen, L. H.(2002)。Mean shifts detection and classification in multivariate process: a neuralfuzzy approach。
22.
Waibel, A. ; Hanazawa, T. ; Hinton, G. ; Shikano, K. ; Lang, K. J.(1989)。Phoneme recognition using timedelay neural networks。
23.
Wohler, C. ; Anlauf, J. K.(2001)。Real-time object recognition on image sequences with the adaptable time delay neural network algorithm-applications for autonomous vehicles。
24.
Wu, S. X.(2006)。Abnormal pattern parameters estimation of control chart based on wavelet transform and probabilistic neural network。
25.
Xie, J. X.; Cheng, C. T. ; Chau, K. W. ; Pei, Y. Z.(2006)。A hybrid adaptive time-delay neural network model for multi-step-ahead prediction of sunspot activity。
圖書論文
1.
Rumelhart, D. E.、Hinton, G. E.、Williams, R. J.(1986)。Learning Internal Representations by Error Propagation。Parallel distributed processing: explorations in the microstructure of cognition。Cambridge, MA:MIT Press。
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