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| 2. | Chien, C.-F.、Wang, W. C.、Cheng, J. C.(2007)。Data mining for yield enhancement in semiconductor manufacturing and an empirical study。Expert Systems with Applications，33(1)，192-198。 |
| 3. | Hsu, Shao-Chung、Chien, Chen-Fu(2007)。Hybrid data mining approach for pattern extraction from wafer bin map to improve yield in semiconductor manufacturing。International Journal of Production Economics，107(1)，88-103。 |
| 4. | 彭金堂、張盛鴻、簡禎富、楊景晴(20051000)。建構關聯規則資料挖礦架構及其在臺電配電事故定位之研究。資訊管理學報，12(4)，121-141。 延伸查詢 |
| 5. | 雷良煥、黃吉成、徐永珍(20100200)。後來居上的CMOS影像感測器。物理，32(1)，24-29。 延伸查詢 |
| 6. | Bi, X.、Zhuang, C.、Ding, H.(2009)。A new Mura defect inspection way for TFT-LCD using level set method。IEEE Signal Processing Letters，16(4)，311-314。 |
| 7. | Casali, A.、Ernst, C.(2012)。Discovering correlated parameters in semiconductor manufacturing processes: a data mining approach。IEEE Transactions on Semiconductor Manufacturing，25(1)，118-127。 |
| 8. | Chen, A.、Hong, A.(2010)。Sample-efficient regression trees (SERT) for semiconductor yield loss analysis。IEEE Transaction on Semiconductor Manufacturing，23(3)，358-369。 |
| 9. | Chen, L. F.、Su, C. T.、Chen, M. H.(2009)。A neural-network approach for defect recognition in TFT-LCD photolithography process。IEEE Transactions on Electronics Packaging Manufacturing，32(1)，1-8。 |
| 10. | Chen, Ying-jen、Lin, Tzu-hsiang、Chang, Kuo-hao、Chien, Chen-fu(20131200)。Feature Extraction for Defect Classification and Yield Enhancement in Color Filter and Micro-Lens Manufacturing: An Empirical Study。工業工程學刊，30(8)，510-517。 |
| 11. | Chien, C.-F.、Chang, K.-H.、Wang, W.-C.(2014)。An empirical study of design-of-experiment data mining for yield-loss diagnosis for semiconductor manufacturing。Journal of Intelligent Manufacturing，25(5)，961-972。 |
| 12. | Chien, C. F.、Chen, Y. J.、Hsu, C. Y.(2015)。A novel approach to hedge and compensate the critical dimension variation of the developed-and-etched circuit patterns for yield enhancement in semiconductor manufacturing。Computers & Operations Research，53，309-318。 |
| 13. | Chien, C. F.、Chen, Y. J.、Hsu, C. Y.、Wang, H. K.(2014)。Overlay error compensation using advanced process control with dynamically adjusted proportional-integral R2R controller。IEEE Transactions on Automation Science and Engineering，11(2)，473-484。 |
| 14. | Chien, Chen-Fu、Chuang, Shih-Chung(2014)。A framework for root cause detection of sub-batch processing system for semiconductor manufacturing big data analytics。IEEE Transactions on Semiconductor Manufacturing，27(4)，475-488。 |
| 15. | Chien, C.-F.、Hsu, C. Y.(2014)。Data mining for optimizing IC feature designs to enhance overall wafer effectiveness。IEEE Transactions on Semiconductor Manufacturing，27(1)，71-82。 |
| 16. | Chien, C. F.、Hsu, C. Y.、Chen, P. N.(2013)。Semiconductor fault detection and classification for yield enhancement and manufacturing intelligence。Flexible Services and Manufacturing Journal，25(3)，367-388。 |
| 17. | Chien, C. F.、Hsu, S. C.、Chen, Y. J.(2013)。A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligence。International Journal of Production Research，51(8)，2324-2338。 |
| 18. | Chien, C. F.、Liu, C. W.、Chuang, S. C.(2015)。Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancement。International Journal of Production Research。 |
| 19. | 許嘉裕、簡禎富、林國義、簡禎裕(20100300)。Data Mining for Yield Enhancement in TFT-LCD Manufacturing: an Empirical Study。工業工程學刊，27(2)，140-156。 延伸查詢 |
| 20. | 許嘉裕、簡禎富、陳培穠(20120700)。Manufacturing Intelligence for Early Warning of Key Equipment Excursion for Advanced Equipment Control in Semiconductor Manufacturing。工業工程學刊，29(5)，303-313。 |
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| 22. | Liu, C. W.、Chien, C. F.(2013)。An intelligent system for wafer bin map defect diagnosis: an empirical study for semiconductor manufacturing。Engineering Applications of Artificial Intelligence，26(5)，1479-1486。 |
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| 24. | Tseng, D. C.、Chung, I. L.、Tsai, P. L.、Chou, C. M.(2011)。Defect classification for LCD color filters using neural-network decision tree classifier。International Journal of Innovative Computing, Information and Control，7(7A)，3695-3707。 |
| 25. | Tu, K. K. W.、Lee, J. C. S.、Lu, H. H. S.(2009)。A novel statistical method for automatically partitioning tools according to engineers' tolerance control in process improvement。IEEE Transactions on Semiconductor Manufacturing，22(3)，373-380。 |
| 26. | Yu, H. C.、Lin, K. Y.、Chien, C. F.(2014)。Hierarchical indices to detect equipment condition changes with high dimensional data for semiconductor manufacturing。Journal of Intelligent Manufacturing，25(5)，933-943。 |
| 27. | 簡禎富、林昀萱、鄭仁傑(20080600)。建構模糊決策樹及其在有交互作用之半導體資料之資料挖礦以提昇良率之研究。品質學報，15(3)，193-210。 延伸查詢 |
| 28. | Braha, D.、Shmilovici, A.(2003)。On the use of decision tree induction for discovery of interactions in a photolithographic process。IEEE Transactions on Semiconductor Manufacturing，16(4)，644-652。 |
| 29. | Chien, C.-F.、Chen, L. F.(2007)。Using rough set theory to recruit and retain high-potential talents for semiconductor manufacturing。IEEE Transactions on Semiconductor Manufacturing，20(4)，528-541。 |
| 30. | Chien, C.-F.、Hsu, C. Y.(2006)。A novel method for determining machine subgroups and backups with an empirical study for semiconductor manufacturing。Journal of Intelligent Manufacturing，17(4)，429-439。 |
| 31. | Chien, C.-F.、Hsu, C. Y.(2011)。UNISON analysis to model and reduce step-and-scan overlay errors for semiconductor manufacturing。Journal of Intelligent Manufacturing，22(3)，399-412。 |
| 32. | Li, W.-C.、Tsai, D.-M.(2011)。Defect inspection in low-contrast LCD images using Hough transform-based nonstationary line detection。IEEE Transactions on Industrial Informatics，7(1)，136-147。 |
| 33. | 簡禎富、林國義、許鉅秉、吳政鴻(20160300)。臺灣生產與作業管理之相關期刊文獻回顧與前瞻：從工業3.0到工業3.5。管理學報，33(1)，87-103。 延伸查詢 |