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題名：Feature Extraction for Defect Classification and Yield Enhancement in Color Filter and Micro-Lens Manufacturing: An Empirical Study
書刊名：工業工程學刊
作者：Chen, Ying-jen／Lin, Tzu-hsiang／Chang, Kuo-hao／Chien, Chen-fu
出版日期：2013
卷期：30:8
頁次：頁510-517
主題關鍵詞：Surface defect detection；Color filter and micro-lens processes；Classification and regression tree；Fature extraction；Yield enhancement
原始連結：連回原系統網址new window
相關次數：
  • 被引用次數被引用次數:期刊(2) 博士論文(0) 專書(0) 專書論文(0)
  • 排除自我引用排除自我引用:2
  • 共同引用共同引用:0
  • 點閱點閱:6
期刊論文
1.Chauhan, S. S.、Proth, J. M.(2005)。Analysis of a supply chain partnership with revenue sharing。International Journal of Production Economics，97，44-51。  new window
2.Canny, J.(1986)。A computational approach to edge detection。IEEE Transactions on Pattern Analysis and Machine Intelligence，8，679-698。  new window
3.Chien, C.-F.、Chen, Y.-J.、Hsu, C.-Y.、Wang, H.-K.。Overlay error compensation using advanced process control with dynamically adjusted proportional-integral R2R controller。IEEE Transactions on Automation Science and Engineering。  new window
4.Chien, C.-F.、Hsu, S.-C.、Chen, Y.-J.(2013)。A System for online detection and classification of wafer bin map defect patterns for manufacturing intelligence。International Journal of Production Research，51，2324-2338。  new window
5.Jiang, B. C.、Wang, C. C.、Chen, P. L.(2004)。Logistic regression tree applied to classify PCB golden finger defects。The International Journal of Advanced Manufacturing Technology，24，496-502。  new window
6.Jiang, B. C.、Wang, C.-C.、Liu, H.-C.(2005)。Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques。International Journal of Production Research，43，67-80。  new window
7.Kuo, C.-F.、Hsu, C.-T. M.、Fang, C.-H.、Chao, S.-M.、Lin, Y.-D.(2013)。Automatic defect inspection system of colour filters using Taguchi-based neural network。International Journal of Production Research，51，1464-1476。  new window
8.Li, W.-C.、Tsai, D.-M.(2012)。Wavelet-based defect detection in solar wafer images with inhomogeneous texture。Pattern Recognition，45，742-756。  new window
9.Liu, C.-W.、Chien, C.-F.(2013)。An intelligent system for wafer bin map defect diagnosis: An empirical study for semiconductor manufacturing。Engineering Applications of Artificial Intelligence，26(5/6)，1479-1486。  new window
10.Tsai, D.-M.、Luo, J.-Y.(2011)。Mean shift-based defect detection in multicrystalline solar wafer surfaces。IEEE Transactions on Industrial Informatics，7，125-135。  new window
11.Tsai, D.-M.、Tsai, H.-Y.(2011)。Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis。Machine Vision and Applications，22，629-649。  new window
12.Tsai, D.-M.、Wu, S.-C.、Chiu, W.-Y.(2013)。Defect detection in solar modules using ICA basis images。IEEE Transactions on Industrial Informatics，9，122-131。  new window
13.Tsai, D.-M.、Wu, S.-C.、Li, W.-C.(2012)。Defect detection of solar cells in electroluminescence images using Fourier image reconstruction image reconstruction。Solar Energy Materials & Solar Cells，99，250-262。  new window
14.Tseng, D.-C.、Chung, I.-L.、Tsai, P.-L.、Chou, C.-M.(2011)。Defect classification for LCD color filters using neural-network decision tree classifier。International Journal of Innovative Computing Information and Control，7，3695-3707。  new window
15.Xie, X.(2008)。A review of recent advances in surface defect detection using texture analysis techniques。Electronic Letters on Computer Vision and Image Analysis，7，1-22。  new window
16.Chou, P. B.、Rao, A. R.、Sturzenbecker, M. C.、Wu, F. Y.、Brecher, V. H.(1997)。Automatic defect classification for semiconductor manufacturing。Machine Vision and Applications，9，201-214。  new window
17.Hsu, S.-C.、Chien, C.-F.(2007)。Hybrid data mining approach for pattern extraction from wafer bin map to improve yield in semiconductor manufacturing。International Journal of Production Economics，107，88-103。  new window
18.Kuo, C.-J.、Chien, C.-F.、Chen, C.-D.(2011)。Manufacturing intelligence to exploit the value of production and tool data to reduce cycle time。IEEE Transactions on Automation Science and Engineering，8(1)，103-111。  new window
19.Li, W.-C.、Tsai, D.-M.(2011)。Defect inspection in low-contrast LCD images using Hough transform-based nonstationary line detection。IEEE Transactions on Industrial Informatics，7(1)，136-147。  new window
會議論文
1.Hani, A. F. M.、Malik, A. S.、Kamil, R.、Thong, C.-M.(2012)。A Review of SMD-PCB Defects and Detection Algorithms。SPIE，1-7。  new window
2.Tasi, D.-M.(2012)。Automatic visual inspection for surface defects。2012 International Symposium on Semiconductor Manufacturing Intelligence (ISMI2012) & 2012 Decision Analysis Symposium (DAS2012)。Hsinchu。  new window
圖書
1.Breiman, L.、Freidman, J. H.、Olshen, R. A.、Stone, C. J.(1984)。Classification and Regression Trees。Pacific Grove, CA：Wadsworth & Brooks/Cole Advanced Books & Softward。  new window
 
 
 
 
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