Feature Extraction for Defect Classification and Yield Enhancement in Color Filter and Micro-Lens Manufacturing: An Empirical Study__臺灣人文及社會科學引文索引資料庫

:::

詳目顯示

回上一頁

第 1 筆 / 總合 1 筆

第一頁

上一頁

下一頁

最後一頁

/1頁

來源文獻資料
引文資料

題名：	Feature Extraction for Defect Classification and Yield Enhancement in Color Filter and Micro-Lens Manufacturing: An Empirical Study
書刊名：	工業工程學刊
作者：	Chen, Ying-jen／Lin, Tzu-hsiang／Chang, Kuo-hao／Chien, Chen-fu
出版日期：	2013
卷期：	30:8
頁次：	頁510-517
主題關鍵詞：	Surface defect detection；Color filter and micro-lens processes；Classification and regression tree；Fature extraction；Yield enhancement
原始連結：	連回原系統網址
相關次數：	被引用次數:期刊(2) 博士論文(0) 專書(0) 專書論文(0) 排除自我引用:2 共同引用:0 點閱:5

期刊論文
1.	Chauhan, S. S.、Proth, J. M.(2005)。Analysis of a supply chain partnership with revenue sharing。International Journal of Production Economics，97，44-51。
2.	Canny, J.(1986)。A computational approach to edge detection。IEEE Transactions on Pattern Analysis and Machine Intelligence，8，679-698。
3.	Chien, C.-F.、Chen, Y.-J.、Hsu, C.-Y.、Wang, H.-K.。Overlay error compensation using advanced process control with dynamically adjusted proportional-integral R2R controller。IEEE Transactions on Automation Science and Engineering。
4.	Chien, C.-F.、Hsu, S.-C.、Chen, Y.-J.(2013)。A System for online detection and classification of wafer bin map defect patterns for manufacturing intelligence。International Journal of Production Research，51，2324-2338。
5.	Jiang, B. C.、Wang, C. C.、Chen, P. L.(2004)。Logistic regression tree applied to classify PCB golden finger defects。The International Journal of Advanced Manufacturing Technology，24，496-502。
6.	Jiang, B. C.、Wang, C.-C.、Liu, H.-C.(2005)。Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques。International Journal of Production Research，43，67-80。
7.	Kuo, C.-F.、Hsu, C.-T. M.、Fang, C.-H.、Chao, S.-M.、Lin, Y.-D.(2013)。Automatic defect inspection system of colour filters using Taguchi-based neural network。International Journal of Production Research，51，1464-1476。
8.	Li, W.-C.、Tsai, D.-M.(2012)。Wavelet-based defect detection in solar wafer images with inhomogeneous texture。Pattern Recognition，45，742-756。
9.	Liu, C.-W.、Chien, C.-F.(2013)。An intelligent system for wafer bin map defect diagnosis: An empirical study for semiconductor manufacturing。Engineering Applications of Artificial Intelligence，26(5/6)，1479-1486。
10.	Tsai, D.-M.、Luo, J.-Y.(2011)。Mean shift-based defect detection in multicrystalline solar wafer surfaces。IEEE Transactions on Industrial Informatics，7，125-135。
11.	Tsai, D.-M.、Tsai, H.-Y.(2011)。Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis。Machine Vision and Applications，22，629-649。
12.	Tsai, D.-M.、Wu, S.-C.、Chiu, W.-Y.(2013)。Defect detection in solar modules using ICA basis images。IEEE Transactions on Industrial Informatics，9，122-131。
13.	Tsai, D.-M.、Wu, S.-C.、Li, W.-C.(2012)。Defect detection of solar cells in electroluminescence images using Fourier image reconstruction image reconstruction。Solar Energy Materials & Solar Cells，99，250-262。
14.	Tseng, D.-C.、Chung, I.-L.、Tsai, P.-L.、Chou, C.-M.(2011)。Defect classification for LCD color filters using neural-network decision tree classifier。International Journal of Innovative Computing Information and Control，7，3695-3707。
15.	Xie, X.(2008)。A review of recent advances in surface defect detection using texture analysis techniques。Electronic Letters on Computer Vision and Image Analysis，7，1-22。
16.	Chou, P. B.、Rao, A. R.、Sturzenbecker, M. C.、Wu, F. Y.、Brecher, V. H.(1997)。Automatic defect classification for semiconductor manufacturing。Machine Vision and Applications，9，201-214。
17.	Hsu, S.-C.、Chien, C.-F.(2007)。Hybrid data mining approach for pattern extraction from wafer bin map to improve yield in semiconductor manufacturing。International Journal of Production Economics，107，88-103。
18.	Kuo, C.-J.、Chien, C.-F.、Chen, C.-D.(2011)。Manufacturing intelligence to exploit the value of production and tool data to reduce cycle time。IEEE Transactions on Automation Science and Engineering，8(1)，103-111。
19.	Li, W.-C.、Tsai, D.-M.(2011)。Defect inspection in low-contrast LCD images using Hough transform-based nonstationary line detection。IEEE Transactions on Industrial Informatics，7(1)，136-147。

會議論文
1.	Hani, A. F. M.、Malik, A. S.、Kamil, R.、Thong, C.-M.(2012)。A Review of SMD-PCB Defects and Detection Algorithms。SPIE，1-7。
2.	Tasi, D.-M.(2012)。Automatic visual inspection for surface defects。2012 International Symposium on Semiconductor Manufacturing Intelligence (ISMI2012) & 2012 Decision Analysis Symposium (DAS2012)。Hsinchu。

圖書
1.	Breiman, L.、Freidman, J. H.、Olshen, R. A.、Stone, C. J.(1984)。Classification and Regression Trees。Pacific Grove, CA：Wadsworth & Brooks/Cole Advanced Books & Softward。

推文
推薦
引用網址
引用嵌入語法
轉寄

第一頁

上一頁

下一頁

最後一頁

:::

相關期刊
相關論文
相關專書
相關著作
熱門點閱

1.	建構彩色濾光膜及微透鏡缺陷樣型分析之資料挖礦架構
2.	Service Dissatisfaction Detection and Service Recovery Analysis Using a Logistic Regression Model: An Empirical Study of Health Management motion sport game

無相關博士論文

1.	建構彩色濾光膜及微透鏡缺陷樣型分析之資料挖礦架構
2.	Service Dissatisfaction Detection and Service Recovery Analysis Using a Logistic Regression Model: An Empirical Study of Health Management motion sport game
3.	建構彩色濾光膜及微透鏡缺陷樣型分析之資料挖礦架構
4.	Service Dissatisfaction Detection and Service Recovery Analysis Using a Logistic Regression Model: An Empirical Study of Health Management motion sport game

無相關著作

無相關點閱

QR Code

QRCODE