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題名:應用ICA與DEA方法評估半導體產業封測領域公司經營績效--以臺灣中型半導體封測廠為例
書刊名:中山管理評論
作者:呂正欽 引用關係高凌菁傅新彬 引用關係
作者(外文):Lu, Cheng-chinKao, Ling-jingFu, Hsin-pin
出版日期:2016
卷期:24:3
頁次:頁503-530
主題關鍵詞:半導體產業經營績效績效評估獨立成份分析資料包絡法Semiconductor industryBusiness performanceEfficiency evaluationIndependent component analysisData envelopment analysis
原始連結:連回原系統網址new window
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  • 被引用次數被引用次數:期刊(0) 博士論文(0) 專書(0) 專書論文(0)
  • 排除自我引用排除自我引用:0
  • 共同引用共同引用:2
  • 點閱點閱:13
期刊論文
1.黃美瑛、黃舒瑜(20100900)。Productivity Evaluation of Taiwanese Semiconductor Companies Using a Three-stage Malmquist DEA Approach。應用經濟論叢,特刊,31-57。new window  延伸查詢new window
2.Zhu, J.(2001)。Super-efficiency and DEA sensitivity analysis。European Journal of Operational Research,129(2),443-455。  new window
3.Wen, H. C.、Huang, J. H.、Cheng, Y. L.(2012)。What Japanese Semiconductor Enterprises Can Learn from the Asset-Light Business Model for Sustainable Competitive Advantage。Asian Business and Management,11(5),615-649。  new window
4.Beasley, J. E.(1990)。Comparing University Departments。Omega International Journal of Management Science,18(2),171-183。  new window
5.Liu, Fuh-Hwa Franklin、Wang, Peng-Hsiang(2008)。DEA Malmquist productivity measure: Taiwanese semiconductor companies。International Journal Production Economics,112(1),367-379。  new window
6.Beckmann, C. F.、Smith, S. M.(2004)。Probabilistic Independent Component Analysis for Functional Magnetic Resonance Imaging。IEEE Transactions on Medical Imaging,24(2),137-152。  new window
7.Beckmann, C. F.(2012)。Modeling with independent components。Neuroimage,62(2),891-901。  new window
8.Chueh, H. E.、Jheng, J. Y.(2012)。Applying data envelopment analysis to evaluation of Taiwanese solar cell industry operational performance。International Journal of Computer Science & Information Technology,4(4),1-8。  new window
9.Déniz, O.、Castrillón, M.、Hernández, M.(2003)。Pace recognition using independent component analysis and support vector machines。Pattern Recognition Letters,24(13),2153-2157。  new window
10.Dulá, J. H.、Hickman, B. L.(1997)。Effects of excluding the column being scored from the DEA envelopment LP technology matrix。Journal of the Operational Research Society,48(10),1001-1012。  new window
11.Eloyan, A.、Ghosh, S. K.(2013)。A semi-parametric approach to source separation using independent component analysis。Computational Statistics & Data Analysis,58(1),383-396。  new window
12.Guo, Y.(2011)。A general probabilistic model for group independent component analysis and its estimation methods。Biometrics,67(4),1532-1542。  new window
13.Hyvärinen, A.、Oja, E.(2000)。Independent component analysis: Algorithms and applications。Neural Networks,13(4),411-430。  new window
14.Roll, Y. W.、Golany, B.(1991)。Controlling factor weights in DEA。IIE Transactions,23(1),2-9。  new window
15.Silva, E.、Stefanou, S.(2003)。Nonparametric Dynamic Production Analysis and the Theory of Cost。Journal of Productivity Analysis,19(2),5-32。  new window
16.Silvey, S. D.(1969)。Multicollinearity and imprecise estimation。Journal of the Royal Statistical Society,31(3),539-552。  new window
17.Weber, C.(2004)。Yield learning and the sources of profitability in semiconductor manufacturing and process development。IEEE Transactions on Semiconductor Manufacturing,17(4),590-596。  new window
18.Adler, N.、Yazhemsky, E.(2010)。Improving discrimination in data envelopment analysis: PCA-DEA or variable reduction。European Journal of Operational Research,202(1),273-284。  new window
19.Bartlett, M. S.、Movellan, J. R.、Sejnowski, T. J.(2002)。Face Recognition by Independent Component Analysis。IEEE Transactions on Neural Networks,13(6),1450-1464。  new window
20.Charnes, A.、Cooper, W. W.(1962)。Programming with Linear Fractional Functions。Naval Research Logistics Quarterly,9(3/4),181-186。  new window
21.Comon, P.(1994)。Independent component analysis: a new concept?。Signal Processing,36(3),287-314。  new window
22.V. David Sánchez A.(2002)。Frontiers of research in BSS/ICA。Neruocomputing,49(1-4),7-23。  new window
23.Dyson, R. G.、Thanassoulis, E.(1988)。Reducing Weight Flexibility in Data Envelopment Analysis。Journal of the Operational Research Society,39(6),563-576。  new window
24.Farrar, D. E.、Glauber, R. R.(1967)。Multicollinearity in Regression Analysis。The Review of Economics and Statistics,49(1),92-107。  new window
25.Hyvärinen, A.(1999)。Fast and robust fixed-point algorithms for independent component analysis。IEEE Transactions on Neural Networks,10(3),626-634。  new window
26.Leachman, R. C.、Hodges, D. A.(1996)。Benchmarking semiconductor manufacturing。IEEE Transactions on Semiconductor Manufacturing,9(2),158-169。  new window
27.Thrall, R. M.(1996)。Duality, Classification and Slacks in DEA。Annals of Operations Research,66(2),109-138。  new window
28.Vigario, R.、Sarela, J.、Jousmaki, V.、Hamalainen, M.、Oja, E.(2000)。Independent Component Approach to the Analysis of EEG and MEG Recordings。IEEE Transactions on Biomedical Engineering,47(5),589-593。  new window
29.Tone, Kaoru(2002)。A slacks-based measure of super-efficiency in data envelopment analysis。European Journal of Operational Research,143(1),32-41。  new window
30.Fried, Harold O.、Lovell, C. A. Knox、Schmidt, Shelton S.、Yaisawarng, Suthathip(2002)。Accounting for Environmental Effects and Statistical Noise in Data Envelopment Analysis。Journal of Productivity Analysis,17(1/2),157-174。  new window
31.Andersen, Per、Petersen, Niels Christian(1993)。A procedure for ranking efficient units in data envelopment analysis。Management Science,39(10),1261-1264。  new window
32.Fried, Harold O.、Schmidt, Shelton S.、Yaisawarng, Suthathip(1999)。Incorporating the Operating Environment into a Nonparametric Measure of Technical Efficiency。Journal of Productivity Analysis,12(3),249-267。  new window
33.Banker, Rajiv D.、Charnes, Abraham、Cooper, William Wager(1984)。Some Models for Estimating Technical and Scale Inefficiencies in Data Envelopment Analysis。Management Science,30(9),1078-1092。  new window
34.Tone, Kaoru(2001)。A slacks-based measure of efficiency in data envelopment analysis。European Journal of Operational Research,130(3),498-509。  new window
35.Farrell, Michael James(1957)。The Measurement of Productive Efficiency。Journal of the Royal Statistical Society: Series A (General),120(3),253-290。  new window
36.Charnes, Abraham、Cooper, William W.、Rhodes, Edwardo(1978)。Measuring the efficiency of decision making units。European Journal of Operational Research,2(6),429-444。  new window
會議論文
1.Carbone, T. A.、Semicond, F.(2000)。Measuring efficiency of semiconductor manufacturing operations using data envelopment analysis。IEEE 2000 Advanced Semiconductor Manufacturing Conference and Workshop。Boston。  new window
2.Chen, W. C.、Chien, C. F.、Chou, M. H.(2008)。Economic efficiency analysis of wafer fabrication facilities。The 2009 Winter Simulation Conference。Miami。  new window
學位論文
1.李明德(2008)。以資料包絡法分析半導體封裝測試廠經營績效(碩士論文)。逢甲大學。  延伸查詢new window
圖書
1.Cichocki, A.、Amari, S.-I.(2002)。Adaptive blind signal and image processing: Learning algorithms and applications。New York. NY:John Wiley and Sons。  new window
2.陳玲君(2012)。2012半導體工業年鑑。新竹:工業技術研究院產業經濟與趨勢研究中心。  延伸查詢new window
3.Kurowicka, D.、Cooke, R. M.(2006)。Uncertainty Analysis and High Dimensional Dependence Modeling。New York:John Wiley & Sons, Inc.。  new window
4.Cover, T. M.、Thomas, J. A.(1991)。Elements of Information Theory。New York, N.Y.:John Wiley and Sons。  new window
5.Hyvärinen, A.、Karhunen, J.、Oja, E.(2001)。Independent Component Analysis。New York, NY:John Wiley and Sons。  new window
6.Lee, T. W.(1998)。Independent Component Analysis: Theory and Application。Boston, MA:Kluwer Academic Publishers。  new window
單篇論文
1.Silva, E.,Lansink, O. A.(2013)。Dynamic efficiency measurement: a directional distance function approach,Wageningen University。  new window
圖書論文
1.Shen, C. W.、Cheng, M. J.、Chi, M. C.(2009)。Measurement of Production Efficiency in Semiconductor Assembly House: Approach of Data Envelopment Analysis。Engineering the Computer Science and IT。New Delhi, IN:In-Teh。  new window
 
 
 
 
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