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題名：Defect Classification Using CNN Transfer Learning and Data Augmentation
書刊名：管理與系統
作者：陳麗妃／黃韻雅／張麗雪／蘇朝墩
作者(外文)：Chen, Li-fei／Huang, Yun-ya／Chang, Li-hsueh／Su, Chao-ton
出版日期：2022
卷期：29:2
頁次：頁223-239
主題關鍵詞：卷積神經網路；遷移學習；資料擴增；瑕疵分類；CNN；Transfer learning；Data augmentation；Defect classification
原始連結：連回原系統網址new window
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  • 點閱點閱:8
期刊論文
1.Tanner, M. A.、Wong, W. H.(1987)。The Calculation of Posterior Distributions by Data Augmentation。Journal of the American Statistical Association，82(398)，528-549。  new window
2.LeCun, Y.、Bottou, L.、Bengio, Y.、Haffner, P.(1998)。Gradient-based learning applied to document recognition。Proceedings of the IEEE，86(11)，2278-2324。  new window
3.Krizhevsky, A.、Sutskever, I.、Hinton, G. E.(2012)。ImageNet Classification with Deep Convolutional Neural Networks。Advances in Neural Information Processing Systems，25(2)，1097-1105。  new window
4.Yang, H.、Mei, S.、Song, K.、Tao, B.、Yin, Z.(2018)。Transfer-Learning-Based Online Mura Defect Classification。IEEE Transactions on Semiconductor Manufacturing，31(1)，116-123。  new window
5.Sousa, M. J.、Moutinho, A.、Almeida, M.(2020)。Wildfire Detection Using Transfer Learning on Augmented Datasets。Expert Systems with Applications，142，1-14。  new window
6.Ogawa, R.、Kido, T.、Kido, T.、Mochizuki, T.(2019)。Effect of Augmented Datasets on Deep Convolutional Neural Networks Applied to Chest Radiographs。Clinical Radiology，74，697-701。  new window
7.Nakazawa, T.、Kulkarni, D. V.(2018)。Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network。IEEE Transactions on Semiconductor Manufacturing，31(2)，309-314。  new window
8.Lu, H. P.、Su, C. T.、Yang, S. Y.、Lin, Y. P.(2020)。Combination of Convolutional and Generative Adversarial Networks for Defect Image Demoiréing of Thin-Film Transistor Liquid-Crystal Display Images。IEEE Transactions on Semiconductor Manufacturing，33(3)，413-423。  new window
9.Lin, H.、Li, B.、Wang, X.、Shu, Y.、Niu, S.(2019)。Automated Defect Inspection of LED Chip Using Deep Convolutional Neural Network。Journal of Intelligent Manufacturing，30，2525-2534。  new window
10.Kumar, S. S.、Abraham, D. M.、Jahanshahi, M. R.、Iseley, T.、Starr, J.(2018)。Automated Defect Classification in Sewer Closed Circuit Television Inspections Using Deep Convolutional Neural Networks。Automation in Construction，91，273-283。  new window
11.Kim, M.、Lee, M.、An, M.、Lee, H.(2020)。Effective Automatic Defect Classification Process Based on CNN with Stacking Ensemble Model for TFT-LCD Panel。Journal of Intelligent Manufacturing，31，1165-1174。  new window
12.He, Y.、Song, K.、Meng, Q.、Yan, Y.(2020)。An End-to-end Steel Surface Defect Detection Approach via Fusing Multiple Hierarchical Features。IEEE Transactions on Instrumentation and Measurement，69(4)，1493-1504。  new window
13.Han, D.、Liu, Q.、Fan, W.(2018)。A New Image Classification Method using CNN Transfer Learning and Web Data Augmentation。Expert Systems with Applications，95，43-56。  new window
14.Ding, J.、Chen, B.、Liu, H.、Huang, M.(2016)。Convolutional Neural Network with Data Augmentation for SAR Target Recognition。IEEE Geoscience and Remote Sensing Letters，13(3)，364-368。  new window
15.Cheon, S.、Lee, H.、Kim, C. O.、Lee, S. H.(2019)。Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class。IEEE Transactions on Semiconductor Manufacturing，32(2)，163-170。  new window
16.Chen, W.、Gao, Y.、Gao, L.、Li, X.(2018)。A New Ensemble Approach Based on Deep Convolutional Neural Networks for Steel Surface Defect Classification。Procedia CIRP，72，1069-1072。  new window
17.Bankar, J.、Gavai, N. R.(2018)。Convolutional Neural Network Based Inception: V3 Model for Animal Classification。International Journal of Advanced Research in Computer and Communication Engineering，7(5)，142-146。  new window
會議論文
1.Kingma, D. P.、Ba, J. L.(2015)。ADAM: A method for stochastic optimization。The 3rd International Conference on Learning Representations。  new window
2.Szegedy, C.、Liu, W.、Jia, Y.、Sermanet, P.、Reed, S.、Anguelov, D.、Erhan, D.、Vanhoucke, V.、Rabinovich, A.(2015)。Going Deeper with Convolutions。The 2015 IEEE Conference on Computer Vision and Pattern Recognition。IEEE Computer Society。1-9。  new window
3.Szegedy, Christian、Vanhoucke, Vincent、Ioffe, Sergey、Shlens, Jon、Wojna, Zbigniew(2016)。Rethinking the inception architecture for computer vision。The IEEE Conference on Computer Vision and Pattern Recognition，(會議日期: 2016/06/27-06/30)，2818-2826。  new window
4.Goodfellow, I.、Pouget-Abadie, J.、Mirza, M.、Xu, B.、Warde-Farley, D.、Ozair, S.、Courville, A.、Bengio, Y.(2014)。Generative Adversarial Networks。The 27th International Conference on Neural Information Processing Systems，2672-2680。  new window
5.He, Kaiming、Zhang, Xiangyu、Ren, Shaoqing、Sun, Jian(2016)。Deep residual learning for image recognition。2016 IEEE Conference on Computer Vision and Pattern Recognition。IEEE。770-778。  new window
6.Yunani, J. L.、Medvedev, M. V.(2019)。Steel Defects Recognition Using Deep Learning。International Multi-Conference on Industrial Engineering and Modern Technologies。  new window
7.Yang, J.、Yu, K.、Gong, Y.、Huang, T.(2009)。Linear Spatial Pyramid Matching Using Sparse Coding for Image Classification。IEEE Conference on Computer Vision and Pattern Recognition。  new window
8.Taylor, L.、Nitschke, G.(2018)。Improving Deep Learning with Generic Data Augmentation。The 8th IEEE Symposium Series on Computational Intelligence。  new window
9.Soukup, D.、Huber-Mörk, R.(2014)。Convolutional Neural Networks for Steel Surface Defect Detection from Photometric Stereo Images。10th International Symposium on Visual Computing，668-677。  new window
10.Shang, L.、Yang, Q.、Wang, J.、Li, S.、Lei, W.(2018)。Detection of Rail Surface Defects Based on CNN Image Recognition and Classification。ICACT Conference。  new window
11.Lin, C. Y.、Chen, C. H.、Yang, C. Y.、Akhyar, F.、Hsu, C. Y.、Ng, H. F.(2019)。Cascading Convolutional Neural Network for Steel Surface Defect Detection。AHFE 2019，202-212。  new window
12.Montserrat, D. M.、Lin, Q.、Allebach, J. P.、Delp, E.(2017)。Training Object Detection and Recognition CNN Models Using Data Augmentation。2017 IS&T International Symposium on Electronic Imaging，27-36。  new window
13.Khumaidi, A.、Yuniamo, E. M.、Pumomo, M. H.(2017)。Welding Defect Classification Based on Convolution Neural Network (CNN) and Gaussian Kernel。2017 International Seminar on Intelligent Technology and Its Application。  new window
14.Fröhlich, H. B.、Fantin, A. V.、Oliveira, B. C. F.、Willemann, D. P.、Iervolino, L. A.、Benedet, M. E.、Junior, A. A. G.(2018)。Defect Classification in Shearography Images Using Convolutional Neural Networks。International Joint Conference on Neural Networks。  new window
單篇論文
1.Zagoruyko, S.，Komodakis, N.(2017)。Wide Residual Networks，https://arxiv.org/abs/1605.07146。  new window
 
 
 
 
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