圖書| 1. | Jones, E. R.。A Guide to Component Burn-in Technology。Wakefield Eng. Inc。   |
| 2. | Selby, J.、Miller, S.。Reliability planning and Management--RPM。General Electric。 |
| 3. | Vaccaro, J.、Gorton, H.。Reliability physics Notebook。 |
| 4. | Bazovsky, I.。Reliability Theory and Practice。 |
| 5. | Myers, R.、Wong, K.、Gordy, H.。Reliability Engineering for Electronic Systems。 |
| 6. | Starr, M. K.。Product Design and Decision Theory。 |
| 7. | Case, C.、Miletta, J.。Capacitor Failure Due to High Level Electrical Transients。Harry Diamond Laboratories。 |
| 8. | Blanchard, B. S.、Lawery, E. E.。Maintainability principles and practices。 |
| 9. | Lennos, C. R.。Experimental Results of Testing Resistors under pulse Conditions。Sandia Laboratories。 |
| 10. | Chamow, M. F.、Smith, W. M.。Some Precepts of Reliable Electronic Design。 |
| 11. | Vaccaro, J.。Semiconductor Reliability with the U.S. DOD。 |