臺灣人文及社會科學引文索引資料庫系統

:::

詳目顯示

回上一頁
第 1 筆 / 總合 1 筆   第一頁 上一頁 下一頁 最後一頁
/1頁
題名：多重品質特性產品之製程能力監控表
作者：游崑慈
作者(外文)：Yu,Kun-Tzu
校院名稱：國立臺灣科技大學
系所名稱：工業管理系
指導教授：徐世輝
學位類別：博士
出版日期：2005
主題關鍵詞：製程能力指標；多重品質特性；非對稱規格；抽樣檢驗；精確度；望小型；望大型；望目型；工程師；Process capability indices；Multiple quality characteristics；Asymmetric tolerances；Sampling inspection
原始連結：連回原系統網址new window
相關次數：
  • 被引用次數被引用次數:期刊(0) 博士論文(0) 專書(0) 專書論文(0)
  • 排除自我引用排除自我引用:0
  • 共同引用共同引用:0
  • 點閱點閱:1
製程能力指標被視為測量產品品質與績效極為有效且良好的方法，但是單一的指標是不夠充份完整的去評估一個具有多重品質特性產品的製程能力。因此，許多學者提出一些能同時監控多品質特性產品的品質分析圖表。可是他們的研究存在一些限制與缺點，第一，有些分析圖表只能適用在具有對稱望目型態品質特性的產品。第二，大部分的研究僅侷限應用在具有單一型態品質特性的產品，然而實際上大部分的產品往往同時具有數個望小型、望大型、以及望目型品質特性。第三，少數研究使用的製程能力指標並無法敏感地反映製程的精確度。第四，一些提出的方法僅根據指標的估計量就結論製程是否達到要求的能力水準，這樣的推論是非常不值得信賴，因為他們並沒有考慮到產品檢驗的方式尤其是忽略了抽樣檢驗時所產生的誤差。因此，為了改善這些缺點，本篇研究分別在全部檢驗與抽樣檢驗兩種情況下提出製程能力監控表(PCMC)。在全部檢驗下，我們建構一個製程能力監控表來評估整個產品的狀況包括非對稱望目型、望小型、以及望大型等品質特性。在抽樣檢驗的情況下，我們又設計 與 兩種製程能力監控表分別適用於產品具有對稱與非對稱型態品質特性。選擇適當的製程能力監控表，不僅能夠合理地反映具有對稱望目型、非對稱望目型、望小型以及望大型等品質特性的產品製程能力，更能夠依照製程能力指標在圖表上的落點指出該製程的精確度。它們將幫助製程工程師更方便去檢視所有品質特性的製程能力是否達到預設的水準，對於不滿意的製程能夠即時發現並進一步採取改善的措施來提升整體製程能力。
Process capability indices (PCIs) can be viewed as an effective and excellent means of measuring product quality and performance, but one single PCI is not sufficient for evaluating an entire product with multiple characteristics. Hence, many scholars have continually been proposing some graphical analysis charts which can simultaneously monitor all quality status for a product with multiple characteristics. However, there are some limitations and shortcomings in this. Firstly, some charts only expressed suitably at symmetric tolerances for the nominal-the-best processes. Secondly, most studies were limited to discussing one single type of quality characteristic. Otherwise, in practice, most products simultaneously have numerical quality characteristics including smaller-the-better, larger-the-better, and nominal-the-best specifications. Thirdly, a few process capability indices used in their charts don’t have enough sensitivity to reflect the accuracy and precision of the process. In the fourth place, some studies simply used the estimators of the indices to determine a point on the charts and then judged whether the processes met the capability requirement. These approaches are highly unreliable, since they don’t consider the methods of inspection and consequently the sampling errors are ignored. In order to improve these shortcomings, the set of Product Capability Monitoring Charts (PCMCs) are proposed in this study, which consider two types of PCMCs, i.e. full inspection and sampling inspection respectively. In full inspection, we construct a PCMC to assess the all quality status of an entire product with bilateral asymmetric tolerances, smaller-the-better and larger-the-better multiple quality characteristics. In the sampling inspection, we construct PCMC and PCMC to assess all process capabilities for products with symmetric tolerances and asymmetric tolerances respectively. Selecting the suitable PCMC, not only reasonably reflects process capabilities of an entire product, but also points out the capability for accuracy with respect to the positions of the indices. They can help the manufacturing engineers to check more conveniently whether the process capabilities satisfy preset level or not. Furthermore, quality improvement actions are taken with respect to unsatisfactory processes to enhance the entire process capability.
[1]Boyles, R.A., Targuchi capability index. Journal of Quality Technology, 23, 17-26, 1991.
[2]Boyles, R.A., Process capability with asymmetric tolerances, Communications in Statistics-Simulation and Computation, 23, 615-643, 1994.
[3]Boyles, R.A., Multivariate process analysis with lattice data. Technometrics. 38(1), 37-49, 1996.
[4]Huang, C.C., Evaluation model for process capability of machining. Dissertation, National Chin-Yi Institute of Technology, Taiwan. 2003
[5]Choi, B.C., and Owen D.B., Applied multivariate statistical analysis, 3rd edn (New York: Prentice-Hall), 1990.
[6]Chan, H., A multivariate process capability index over a rectangular solid tolerances zone. Statistica Sinica, 4, 749-758, 1994.
[7]Chan, L.K. Cheng, S.W, and Spring, F.A, A new measure of process capability: Cpm., Journal of Quality Technology, 20(3),162-175, 1988.
[8]Chen, K.S., Huang, M.L. and Li, R. K. Process capability analysis for an entire product. International Journal of Production Research, 39, 17, 4077-4087, 2001.
[9]Chen, K.S., Process capability indices. Ph.D. Dissertation, Department of Industrial Engineering and Management, National Chiao-Tung University, 1995.
[10]Chen, K.S. Pearn, W.L. and Lin, P.C., A new generalization of Cpm for process with asymmetric tolerances. International Journal of Reliability, Quality and Safety Engineering, 6(4), 383-398, 1999.
[11]Chou, Y.M. Owen, D.B., On the distribution of the estimated process capability indices. Commun Stat: Theory Math 18(12), 4549-60, 1989.
[12]Davis, R.B., A capability study for an entire product. ASQC Quality Congress Transactions, 172-178, 1992.
[13]Deleryd, M., A pragmatic view on process capability studies. Int. J. Production Economics, 58, 319-330, 1999.
[14]Huang, M.L and Chen, K.S., Capability analysis for a multi-process product with bilateral specifications. International Journal of Advanced Manufacturing Technology, 21: 801-806, 2003.
[15]Huang, M.L. Chen, K.S. and Hung, Y.H., Integrated process capability analysis with an application in backlight module. Microelectronics and Reliability,42 2009-2014, 2002.
[16]Kuo, H.-L., On bayesian estimations and muti-characteristics for process capability indices. Dissertation, Tamkang University of Management Sciences, 2002.
[17]Kane, V.E., Process capability indices. Journal of Quality Technology,18, 41-52,1986.
[18]Kotz, S., and Johnson, N.L., Process capability indices. (London:Chapman and Hall), 1993.
[19]Chen, K.S., Li, R.K., and Liao, S.J., Capability evaluation of a product family for processes of the lager-the-better type. International Journal of Advanced Manufacturing Technology,20: 824-832, 2002.
[20]Chen, K.S., Pearn, W.L. and Lin, P.C., Capability measures for processes with multiple characteristics. Quality and Reliability Engineering International 19: 101-110, 2003.
[21]Hung, M.C. Integrated Process Capability Analysis. Dissertation, National Taiwan University of Science and Technology, 2003.
[22]Montgomery, D.C. Introduction to statistical quality control. 4th ed. New York, NY: John Wiley & Sons Inc; 2001.
[23]Pearn, W.L., Kotz, S. and Johnson, N.L., Distributional and inferential properties of process capability indices. Journal of Quality Technology, 24, 216-231, 1992.
[24]Pearn, W.L. and Chen, K.S., A Bayesian-like estimator of Cpk. Commun. Statist.-Simul. Comput., 25,321-329, 1996
[25]Pearn, W. L. and Chen, K.S., Multi-process performance analysis: a case study. Quality Engineering, 10(1),1-8, 1997.
[26]Pearn, W.L. and Chen, K.S., New generalization of the process capability index Cpk. Journal of Applied Statistics, 25(6), 801-810, 1998.
[27]Pearn, W. L., Lin, P. C. and Chen, K.S., On the Generalizations of the capability index Cpmk for asymmetric tolerances. Far East J. Theo. Stat. 3(1), 49-66, 1999.
[28]Pearn, W.L. and Chen, K.S., Making decisions in assessing process capability index Cpk. Quality and Reliability Engineering International, 15, 321-326, 1999.
[29]Pearn, W.L. Lin, P.C. and Chen, K.S., Estimating process capability index for asymmetric tolerances: Distributional properties. Metrika 54:261-279, 2001.
[30]Pearn, W. L. and Chen, K.S., One-sided capability indices Cpu and Cpl: decision making with sample information. International Journal of Quality & Reliability Management, 19(3):221-45, 2002.
[31]Pearn, W.L., and Shu, M.H., Manufacturing capability control for multiple power-distribution switch processes based on modified Cpk MPPAC. Microeletronics and Reliability 43,963-975, 2003.
[32]Pearn, W.L., and Shu, M.H., An algorithm for calculating the lower confidence bounds of Cpu and Cpl with application to lower-drop-out linear regulators. Microeletronics and Reliability 43, 495-502, 2003.
[33]Pearn, W.L., Shu, M.H. Hsu, B.M., Cpm MPPAC for manufacturing quality control applied to precision voltage reference process. International Journal of Advanced Manufacturing Technology, 23:712-719, 2004
[34]Lin, P.C. and Pearn, W.L., Testing process capability for one-sided specification limit with application to the voltage level translator. Microeletronics and Reliability 42, 1975-1983, 2002.
[35]Quality System Requirement QS9000, 3rd edn, 1988.
[36]Ruczinski, The relation between Cpm and the degree of inclusion. Doctoral dissertation, University of Wurzburg, Wurzburg, Germany, 1996.
[37]Singhal, S.C., Multi-process performance analysis chart (MPPAC) with capability zones. Quality Engineering, 4(1), 75-81, 1991.
[38]Spiring, F.A., An unifying approach to process capability indices. Journal of Quality Technology, 29(1),49-58, 1997.
[39]Vännman, K., A unified approach to process capability indices. Statistica Sinica 5, 805-820, 1995.
[40]Vännman, K., A general class of capability indices in the case of Asymmetric tolerances. Communications in Statistics-Theory and Methods, 26(8), 2049-2072, 1997.
[41]Vännman, K. and Deleryd, M., Process capability plots - a quality improvement tool. Quality Reliability Int; 15: 213-7, 1999.
[42]Sung, W.P. Chen K.S. and Go, C. G.., Analysis method of process capability for steel. International Journal of Advanced Manufacturing Technology, 20, 480-486, 2002.
[43]Sung, W.P. and Chen, K.S., An analytical method for the process capability of a precision component of an instrument. International Journal of Advanced Manufacturing Technology, 24, 126-131, 2004.
 
 
 
 
第一頁 上一頁 下一頁 最後一頁 top
QR Code
QRCODE

臺灣人文及社會科學引文索引資料庫

目前上線人數：1005（臺灣：990，外國：15） ／ 本年度總使用人次：2344557 ／ 訪客人次（自102年09月）：68152119
國家圖書館著作權聲明 Copyright © 2013 All rights reserved.
本館地址: 100201臺北市中山南路20號． 本館地圖及交通資訊．
總機：(02)23619132．最佳瀏覽解析度為1024x768以上