An Effective Modern Approach for Measuring High-Tech Product Manufacturing Process Quality_

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題名：	An Effective Modern Approach for Measuring High-Tech Product Manufacturing Process Quality
書刊名：	工業工程學刊
作者：	彭文理／吳建瑋
作者(外文)：	Pearn, W. L.／Wu, Chien-wei
出版日期：	2005
卷期：	22:2
頁次：	頁119-133
主題關鍵詞：	臨界值；產品不良率；信賴下界；百萬分之一；製程能力指標；Critical values；Fraction of nonconformities；Lower confidence bound；PPM；Process capability indices
原始連結：	連回原系統網址
相關次數：	被引用次數:期刊(1) 博士論文(0) 專書(0) 專書論文(0) 排除自我引用:1 共同引用:0 點閱:30

　　　　　近年來，隨業製程技術的快速進行，供應商不斷要求產品具有高的水準以及相當低的產品不良率。然而，由於在這些高品質製程(不良品敗通常用百萬分之一為衝量單位)所取出適當大小的樣本中幾乎沒有不良品，因此傳統用來衝量這些傳不良率製程的報變得沒有效率具不適用。有鑑於此，本研究提出一個評估高科技產品製程水準的有效方法，也就是利製程能力指標來評估製程能力與產出績效。此外，本文亦針對一些實務上的推廣及應用情形提出應論與建議。因此，操作人員可能根據所提出的檢定程序簡單地斷他們的製程是否達到指定所要求的製程能力水準，以做為衡量製程能力好壞及接單與否的重要參考。

以文找文

　　　　　As rapid advancement of the manufacturing technology, suppliers require their require their products be high quality with very low fraction of nonconformities. Traditional methods for measuring fraction of nonconformities become inapplicable for those high quality process since any manufacturing sample of reasonable size likely contains no defective product items. In this paper, we first comment on the classical approach, then present an effective modern approach based on process capability indices for measuring manufacturing process quality, specifically for high technology product requiring very low fraction of nonconformities (often measured in PPM, parts per million). In addition, several implementation issues and extensions and discussed. The manufacturers can use the presented approach to perform quality testing and determine whether their processes are capable for reproducing product items satisfying customers’ stringent quality requirements.

以文找文

期刊論文
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34.	Chan, L. K.、Cheng, S. W.、Spiring, F. A.(1988)。Process Capability Indices for Skewed Populations。Journal of Quality Technology，20(3)，162-175。
35.	Chen, K. S.、Pearn, W. L.、Lin, P. C.(1999)。A New Generalization of the Capability Index Cpm for Asymmetric Tolerances。International Journal of Reliability, Quality & Safety Engineering，6(4)，383-393。
36.	陳思勉、Hsu, Nai-Feng(1995)。The Asymptotic Distribution of the Process Capability Index Cpmk。Communications in Statistics: Theory and Methods，24(5)，1279-1291。
37.	Chou, Y. M.、Polansky, A. M.、Mason, R. L.(1998)。Transforming Non-normal Data to Normality in Statistical Process Control。Journal of Quality Technology，30(2)，133-141。
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50.	Pearn, W. L.、Lin, P. C.(2002)。Computer Program for Calculating the p-VALUE in Testing Process Capability Index Cpmk。Quality and Reliability Engineering International，18(4)，333-342。
51.	Pearn, W. L.、Shu, M. H.(2003)。Lower Confidence Bounds with Sample Size Information for Cpm Applied to Production Yield Assurance。International Journal of Production Research，41(15)，3581-3599。
52.	蘇明鴻、Pearn, W. L.(2003)。Manufacturing Capability Control for Multiple Power-Distribution Switch Processes Based on Modified Cpk MPPAC。Microelectronics Reliability，43(6)，963-975。
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學位論文
1.	Deleryd, Mats(1996)。Process Capability Studies in Theory and Practice，0。
2.	Ruczinski, I.(1996)。The Relation between Cpm and the Degree of Includence，Würzburg, Germany。

圖書
1.	Harry, M. J.(1988)。The Nature of Six Sigma Quality。The Nature of Six Sigma Quality。Schaumburg, IL：Motorola Inc.。
2.	Lovelace, C.、Kotz, S.(1998)。Process Capability Indices in Theory and Practice。London：Arnold。
3.	Kotz, Samuel、Johnson, Norman L.(1993)。Process Capability Indices。Chapman and Hill。
4.	Montgomery, Douglas C.(2001)。Introduction to Statistical Quality Control。New York：John Wiley & Sons。
5.	Hoskins, J.、Stuart, B.、Taylor, J.(1988)。A Motorola Commitment: A Six-sigma Mandate。The Motorola Guide to Statistical Process Control for Continuous Improvement towards Six-sigma Quality。Phoenix, AZ。

其他
1.	吳建瑋，Pearn, W. L.(2003)。Measuring Manufacturing Capability for Couplers and Wavelength Division Multiplexers，0。

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