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題名:Improving the Plastic Ball Grid Array Assembly Yield: A Case Study
書刊名:工業工程學刊
作者:洪永祥黃美玲
作者(外文):Hung, Y. H.Huang, M. L.
出版日期:2006
卷期:23:4
頁次:頁311-318
主題關鍵詞:PBGA assemblyPlasma cleaningNeural networkGenetic algorithmPBGA組裝電漿清洗類神經網路基因演算法
原始連結:連回原系統網址new window
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  • 被引用次數被引用次數:期刊(0) 博士論文(0) 專書(0) 專書論文(0)
  • 排除自我引用排除自我引用:0
  • 共同引用共同引用:0
  • 點閱點閱:32
期刊論文
1.Tong, L. I.、Su, C. T.、Wang, C. H.(1997)。The optimization of multi-response problems in Taguchi method。International Journal of Quality and Reliability Management,14(4),367-380。  new window
2.Baranyi, A. D.、Seto, L.、Chang, S. K.(1998)。Plasma Cleaning to Improve Wire Bonds。Electronic Packaging and Production,12-16。  new window
3.Ganesan, G. S.、Lewis, G.、Berg, H. M.(1994)。Characterizing Organic Contamination in IC Package Assembly。International Journal of Microcircuits Electronics Packaging,17(2),152-160。  new window
4.Kim, B.、Park, S.(2001)。An Optimal Neural Network Plasma Molde: A Casy Study。Chemometrics and Intelligent Laboratory Systems,56,30-50。  new window
5.Kim, B.、Park, S.(2003)。Plasma Diagnosis by Recognizing in Suit Data Using a Modular Backpropagation Network。Chemometrics and Intelligent Laboratory Systems,65,231-240。  new window
6.Kim, B.、Kim, D. W.、Park, G. T.(2005)。Prediction of Plasma-induced DC Bias Using Polynomial Neural Network。Vacuum,79,111-118。  new window
7.Lee, C.、Gopalakrishnan, R.、Nyunt, K.、Wong, A.、Tan, R. E.、Ong, J. W.(1999)。Plasma Cleaning of Plastic Ball Grid Array Package。Microelectronics Reliability,39,97-105。  new window
8.Moser, E. M.、Faller, C. H.、Pietrzko, S.、Eggimann, F.(1999)。Modeling the Function Performance of Plasma Polymerized Thin Films。Thin Solid Films,335-356,49-54。  new window
9.O'Kane, D. F.、Mittal, K. L.(1974)。Plasma Cleaning Metal Surfaces。Journal of Vacuum Science and Technology,11(3),567-569。  new window
10.Yang, Steve L.、Bernstein, J. B.、Leong, K. C.(2002)。Effect of the Plasma Cleaning Process on Plastic Ball Grid Array Package Assembly Reliability。IEEE Transactions on Electronics Packaging Manufacturing,25(2),91-99。  new window
11.Su, C. T.、Chiang, T. L.(2003)。Optimizing the IC Wire Bonding Process Using a Neural Networks/Genetic Algorithms Approach。Journal of Intelligent Manufacturing,14,229-238。  new window
會議論文
1.Kim, S.(1991)。The Role of Plastic Adhesion in IC Performance。0。  new window
2.Schrader, M. E.(1979)。Surface Contamination Detection through Wettability Measurements。0。697-712。  new window
3.Wong, C. P.、McBride, R.(1994)。Pre-encapsulation Cleaning Methods and Control for Microelectronics Packaging。0。121-133。  new window
4.Yoshida, O.、Okabe, N.、Nagayama, S.、Yamagischi, R.、Murakami, G.(1989)。Improvement of Moisture Resistance in Plastic Encapsulants MOS-IC by Surface Finishing Copper Leadframe。0。464-471。  new window
學位論文
1.潘國松(2003)。Research in the Strength Improvement of Golden Wire Bonding in BGA by the Plasma Cleaning,0。  new window
圖書
1.Goldberg, D. E.(1989)。Gene Algorithm in Search, Optimization and Machine Learning。New York:Massachusetts:Addison-Wesley。  new window
2.Phadke, M. S.(1989)。Quality Engineering Using Robust Design。New Jersey:Prentice-Hall。  new window
3.Holland, J. H.(1975)。Adaptation in Natural and Artificial Systems: An Introductory Analysis with Application to Biology, Control, and Artificial Intelligence。MI:University of Michigan Press。  new window
4.Fairfield, C.。Optimization of Ion and Electron Properties in IC Packaging Applications。Optimization of Ion and Electron Properties in IC Packaging Applications。0。  new window
5.Freeman, J.、Skapura, D.(1991)。Neural Networks。Neural Networks。New York, NY。  new window
6.Harman, G. G.(1991)。Reliability and Yield Problems of Wire Bonding in Microelectronics。Reliability and Yield Problems of Wire Bonding in Microelectronics。0。  new window
7.Plasma Surface Modification of Polymers: Relevance to Adhesion。Plasma Surface Modification of Polymers: Relevance to Adhesion。Utrecht, Netherlands。  new window
8.White, M. L.(1970)。The Detection and Control of Organic Contamination on Surfaces。Clean Surfaces。New York, NY。  new window
 
 
 
 
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