| 期刊論文1. | Lucas, J. M.、Crosier, R. B.(1982)。Fast Initial Response for CUSUM Quality Control Schemes: Give Your CUSUM a Head Start。Technometrics,24(3),199-205。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 2. | Pugh, G. A.(1991)。A comparison of neural networks to SPC charts。Computers and Industrial Engineering,21,253-255。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 3. | Crosier, R. B.(1986)。A New Two-Sided Cumulative Sum Quality Control Scheme。Technometrics,28,187-194。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 4. | Lucas, J. M.(1982)。Combined Shewhart-CUSUM quality control schemes。Journal of Quality Technology,14(2),51-59。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 5. | Lucas, J. M.(1973)。A modified V mask control scheme。Technometrics,15,833-847。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 6. | Gan, F. F.(1992)。CUSUM control chart under linear drift。The Statistican,41,71-84。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 7. | Hwarng, H. B.、Hubele, N. F.(1993)。Back-propagation pattern recognizers for X control chart: methodology and performance。Computers and Industrial Engineering,24,291-235。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 8. | Lippman, R. L.(1987)。An introduction to computing with neural nets。IEEE ASSP Magazine,1987(Apr.),4-21。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 9. | Nelson, L. S.(1984)。The Shewhart control chart-tests for special cause。Journal of Quality Technology,16,237-239。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 10. | Page, E. S.(1954)。Continuous inspection schemes。Biometrika,41(1/2),100-115。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 11. | Champ, C. W.、Woodall, W. H.(1987)。Exact Results for Shewhart Control Charts with Supplementary Runs Rules。Technometrics,29(4),393-399。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 圖書1. | Montgomery, Douglas C.(1985)。Introduction to Statistical Quality Control。New York, NY:John Wiley & Sons Inc.。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 2. | Grant, E. L.、Leavenworth, R. S.(1988)。Statistical Quality Control。New York, NY:McGraw-Hill。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 3. | Freeniein, J. A.、Skapura, D. M.(1991)。Neural Network-Algorithms, Applications, and Programming Techniques。Reading, Massachusetts:Addison-Wesley。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 4. | Khanna, T.(1990)。Foundations of Neural Networks。Reading, Massachusetts:Addison-Wesley。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 5. | Duncan, A. J.(1974)。Quality Control and Industrial Statistics。Irwin。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 6. | (1990)。Works Professional II/Plus and Neural Works Explorer。Penn Center West:Neural Ware Inc.。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 7. | (1958)。Statistical Quality Control Handbook。Indianapolis, Indiana:Western Electric Co.。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 圖書論文1. | Rumelhart, D. E.、Hinton, G. E.、Williams, R. J.(1986)。Learning Internal Representations by Error Propagation。Parallel distributed processing: explorations in the microstructure of cognition。Cambridge, MA:MIT Press。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | |