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題名:掃瞄式電子顯微鏡/X-射線能譜分析鑑定紙張上之微量元素
書刊名:警學叢刊
作者:張維敦陳建平林文貴
出版日期:1994
卷期:25:1=97
頁次:頁77-86
主題關鍵詞:射線能譜分析掃瞄式微量元素電子顯微鏡
原始連結:連回原系統網址new window
相關次數:
  • 被引用次數被引用次數:期刊(1) 博士論文(0) 專書(0) 專書論文(0)
  • 排除自我引用排除自我引用:1
  • 共同引用共同引用:2
  • 點閱點閱:12
期刊論文
1.張維敦、李建雄、姜雲生(19940300)。掃描式電子顯微鏡/X射線能譜分析在汽車補漆鑑識上之應用。刑事科學,37,69-78。new window  延伸查詢new window
2.White, R. S.、Qwens, A. D.(1987)。Automation of Gunshot Residue Detection and Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Analysis (SEM/EDX)。Journal of Forensic Sciences,32(6),1595-1603。  new window
3.Totty, R. N.(1990)。Analysis and differentiation of photocopy toners。Forensic Science Review,2(1),2-23。  new window
4.Jousimaa, Kristine、Rautauaori, Heikki(1982)。Preparation of Glass Fragments for Analysis。Journal of Forensic Sciences,27,471-472。  new window
5.Parham, R. A.、Hultman, J. D.(1976)。X-ray diffraction/EDXA/SEM. A more comprehensive approach to pigment characterization。Tappi,29(1),152-153。  new window
6.李驊登(19890900)。掃描式電子顯微鏡之原理及功能。科儀新知,11(2)=52,50-62。  延伸查詢new window
7.Beam, T.、Willis, W.(1990)。Analysis Protocol for Discrimination of Automotive Paints by SEM-EDXA Using Beam Alignment by Current Centering。Journal of Forensic Sciences,35(5),1055-1063。  new window
圖書
1.Saferstein, Richard(1982)。Forensic Science Handbook。New Jersey:Prentice-Hall。  new window
2.陳虎生(1983)。文書鑑定學。桃園縣:中央警官學校。  延伸查詢new window
3.Vaughan, Douglas(1989)。Energy-Dispersive X-Ray Microanalysis: An Introduction。San Carlos, CA:Kevex Instruments, Inc.。  new window
4.Brunelle, Richard、Reed, Robert W.(1984)。Forensic Examination of Ink and Paper。Springfield, IL:Charles C. Thomas。  new window
5.Hilton, O.(1982)。Scientific Examination of Questioned Documents。New York:Elsevier Science Publishing Co., Inc。  new window
 
 
 
 
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