| 期刊論文1. | 張維敦、李建雄、姜雲生(19940300)。掃描式電子顯微鏡/X射線能譜分析在汽車補漆鑑識上之應用。刑事科學,37,69-78。 延伸查詢![new window](/gs32/images/newin.png) | 2. | White, R. S.、Qwens, A. D.(1987)。Automation of Gunshot Residue Detection and Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Analysis (SEM/EDX)。Journal of Forensic Sciences,32(6),1595-1603。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 3. | Totty, R. N.(1990)。Analysis and differentiation of photocopy toners。Forensic Science Review,2(1),2-23。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 4. | Jousimaa, Kristine、Rautauaori, Heikki(1982)。Preparation of Glass Fragments for Analysis。Journal of Forensic Sciences,27,471-472。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 5. | Parham, R. A.、Hultman, J. D.(1976)。X-ray diffraction/EDXA/SEM. A more comprehensive approach to pigment characterization。Tappi,29(1),152-153。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 6. | 李驊登(19890900)。掃描式電子顯微鏡之原理及功能。科儀新知,11(2)=52,50-62。 延伸查詢![new window](/gs32/images/newin.png) | 7. | Beam, T.、Willis, W.(1990)。Analysis Protocol for Discrimination of Automotive Paints by SEM-EDXA Using Beam Alignment by Current Centering。Journal of Forensic Sciences,35(5),1055-1063。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 圖書1. | Saferstein, Richard(1982)。Forensic Science Handbook。New Jersey:Prentice-Hall。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 2. | 陳虎生(1983)。文書鑑定學。桃園縣:中央警官學校。 延伸查詢![new window](/gs32/images/newin.png) | 3. | Vaughan, Douglas(1989)。Energy-Dispersive X-Ray Microanalysis: An Introduction。San Carlos, CA:Kevex Instruments, Inc.。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 4. | Brunelle, Richard、Reed, Robert W.(1984)。Forensic Examination of Ink and Paper。Springfield, IL:Charles C. Thomas。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | 5. | Hilton, O.(1982)。Scientific Examination of Questioned Documents。New York:Elsevier Science Publishing Co., Inc。 ![](/gs32/thssjcncl/image/nclsfx.gif) ![new window](/gs32/images/newin.png) | |