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題名:應用機器視覺系統於表面瑕疵分類之研究
書刊名:工業工程學刊
作者:江行全 引用關係林泰宗王建智
作者(外文):Jiang, Bernard C.Lin, Tai-tsungWang, Chien-chih
出版日期:1999
卷期:16:4
頁次:頁443-453
主題關鍵詞:機器視覺表面瑕疵油封分類器Machine visionSurface defectsOil-sealClassifier
原始連結:連回原系統網址new window
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  • 被引用次數被引用次數:期刊(0) 博士論文(0) 專書(0) 專書論文(0)
  • 排除自我引用排除自我引用:0
  • 共同引用共同引用:1
  • 點閱點閱:58
期刊論文
1.Chapman, K. W.、Johnson, C.、McLean, T. J.(1990)。A High Speed Statistical Process Control Application of Machine Vision to Electronics Manufacturing。Computers & Industrial Engineering,19(1-4),234-238。  new window
2.Rigney, M. P.、Brusewitz, G. H.、Kranzler, G. A.(1992)。Asparagus Defect Inspection with Machine Vision。American Society of Agricultural Engineers,35(6),1873-1878。  new window
3.Xlan, W.、Zhang, Y.、Tu, Z.、Hall, E. L.(1990)。Automatic Visual Inspection of the Surface Appearance Defects of Bearing Roller。Proceedings IEEE International Conference on Robotics and Automation,3,1490-1494。  new window
4.Wu, W.、Wang, M. J.、Liu, C.(1996)。Automated Inspection of Printed Boards through Machine Vision。Computers in Industry,28(2),103-111。  new window
5.Eppinger, S. D.、Huber, C. D.、Pham, V. H.(1995)。A Methodology for Manufacturing Process Signature Analysis。Journal of Manufacturing Systems,14(1),20-34。  new window
6.Shen, L.、Rangayyan, R. M.、Desautels, J. E.(1993)。Detection and Classification of Mammographic Calcifications。International Journal of Pattern Recognition and Artificial Intelligence,7(6),1403-1416。  new window
7.Raafat, H.、Taboun, S.(1996)。An Integrated Robotics and Machine Vision System for Surface Flaw Detection and Classification。Computers in Industrial Engineers,30(1),27-40。  new window
8.Jiang, B. C.、Jiang, S. J.(1998)。Machine Vision Based Inspection of Oil Seals。Journal of Manufacturing Systems,17(3),159-166。  new window
9.Taylor, C. J.、Woods, W.、Copper, D. H.、Dixon, R. N.(1987)。The Use of Geometric and Gray-Level Models for Industrial Inspection。Pattern Recognition Letters,5(11-17)。  new window
10.Chou, P. B.、Rao, A. R.、Stureenbecker, M. C.、Wu, F. Y.、Brecher, V. H.(1997)。Automatic Defect Classification for Semiconductor Manufacturing。Machine Vision and Applications,9,201-214。  new window
11.Petove, D.、Hinkle, E. B.(1987)。A Rule-Based System for Verifying Engineering Specifications in Industrial Visual Inspection Applications。IEEE Trans. Pattern Anal. Machine Intell,PAMI-9(2),306-311。  new window
12.彭德保、蔡孟儒(1997)。應用機器視覺於透明容器內異物之自動化檢測。工業工程學刊,14(1),61-70。new window  延伸查詢new window
13.Conners, R. M.、Mcmillin, C. W.、Lin, K.、Vasquez-Espinosa, R. E.(1983)。Identifying and locating surface defects in wood: parts of an automated lumber processing system。IEEE Trans. Pattern Anal. Machine Intell.,PAMI-5(2),573-583。  new window
14.Sun, Y. N.、Tsai, C. T.(1992)。A New Model-Based Approach for Industrial Visual Inspection。Pattern Recognition,25,1327-1336。  new window
15.Otsu, U. M.(1979)。A Threshold Selection Method form Gray-Level Histograms。IEEE Transactions on System Man and Cybernetics,SMC-9(1),62-66。  new window
圖書
1.Ceilo, P.(1987)。Optical Techniques for Industrial Inspection。Optical Techniques for Industrial Inspection。New York, NY。  new window
 
 
 
 
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