本研究假設：人對對稱圖形有較高的辨識性。透過實驗設計：「圖形再認實驗」，以實驗法驗證之。「圖形再認實驗」的過程是以200個黑白的幾何圖形，設計構成50組各類對稱與非對稱的學習圖形及干擾圖群，再透過實驗的方法與程序，記錄60名受試者在1秒的觀看學習時間與1.5秒的反應時間中選取的圖形，各類「對稱」圖形及不對稱的圖形被辨識再認的次數如何？從實驗結果發現按其p值顯著性，可區分為高、中、低三種再認率的圖形群，同時也發現各圖形分別受對稱形式與構成元素相互的影響。由△○□構成的圖形普遍而言，再認率較單位形構成的圖形低，不易辨識。具有放射對稱(PL)的圖形辨識再認性高於其他圖形，旋轉對稱(P)的圖形再認性偏低，鏡映對稱(L)的圖形則依構成的元素不同而有不同程度的再認性，不對稱圖形(Non)普遍再認率偏低，僅以單位形構成的復雜不對稱圖形(uniNc)再認率偏高。整體而言在相同時間控制與圖形數量控制的前提下，透過幾何圖形再認作業發現，以同時具有點與線對稱(SymLP)的放射對稱圖形再認率最高，本研究經過實驗分析後，更進一步的提出：具有放射對稱圖形(SymLP)辨識再認性高於其他幾何圖形。

A hypothese about the learning and memory of symmetrical patterns in graphic design was tested in the present study. The hypothese, which states that symmetrical patterns are easier to be remembered, was investigated with a pattern-recognition experiment. In the experiment, graphic patterns were displayed for 1.5 second during the learning episode. The subjects were then asked to pick up the patterns that they just saw with a 4AFC task to test their pattern-recognition, and the rates of correct answer were recorded. The results showed a better general performance for the symmetrical patterns over the non-symmetrical patterns in the recognition task. Symmetrical patterns that produced with different structure principles also have different levels of correct rates. Both the compositional elements used to build the experimental patterns and the styles of symmetry affected the recognition task performance. Patterns composed by△○□elements had lower recognition rates than those composed by a single unit. Symmetrical patterns with both mirrored and radial structures showed the best recognition performance over other symmetrical patterns tested in the present study.