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題名：建構半導體製造管理目標層級架構與製造資料之資料挖礦
書刊名：工業工程學刊
作者：簡禎富／蕭禮明／王興仁
作者(外文)：Chien, Chen-fu／Hsiao, Allen／Wang, Ivan
出版日期：2004
卷期：21:4
頁次：頁313-327
主題關鍵詞：資料挖礦；製造資料分析；半導體製造管理；目標層級架構；決策分析；Data mining；Manufacturing data analysis；Semiconductor manufacturing management；Performance index hierarchy；Decision analysis
原始連結：連回原系統網址new window
相關次數：
  • 被引用次數被引用次數:期刊(8) 博士論文(0) 專書(1) 專書論文(0)
  • 排除自我引用排除自我引用:4
  • 共同引用共同引用:22
  • 點閱點閱:160
　　　　　半導體廠製造管理績效指標間的關係複雜且彼此影響，難以用簡單的模式或依賴人為直觀方法加以釐清。然而，既有半導體製造管理研究大多偏重個別指標之局部最佳化。本研究回顧相關文獻、訪談領域專家，以發展半導體製造管理指標層級，並定義各個指標及其使用規則，讓管理者或決策者能夠了解指標之間的關係，以協助使用者作為管理之依據。本研究並進而以某半導體廠為實證以檢驗其效度，分析實際生產時的資料，利用資料挖礦找出指標間特殊的樣型與規則，以實證推導的模式和指標之間的具體關係，作為半導體廠製造管理決策的參考。
　　　　　The indexes for semiconductor manufacturing management are complicated and interrelated. Therefore, it is hard to clarify the relationships among the indexes and to derive useful rules for production management. Existing approaches rely on following individual indexes without considering the production system as a whole. This study aims to fill the gap by reviewing the related studies on semiconductor manufacturing management and developing a complete set of performance indexes in hierarchy. In addition, we apply data mining techniques for analyzing production data collected in a semiconductor fab in Taiwan to validate this approach. The empirically derived patterns among the critical indexes were useful for supporting production management decisions. The results demonstrate the practical viability of this approach. This study concludes with results and discussion on future research.
期刊論文
1.Braha, D.、Shmilovici, A.(2002)。Data mining for improving a cleaning process in the semiconductor industry。IEEE Transactions on Semiconductor Manufacturing，15(1)，91-101。  new window
2.Del Castillo Sobrino, M. D.、Barrios Bravo, L. J.(1999)。Knowledge acquisition from batch semiconductor manufacturing data。Intelligent Data Analysis，3(5)，399-408。  new window
3.Wein, L. M.(1992)。On the relationship between yield and cycle time in semiconductor wafer fabrication。IEEE Transactions on Semiconductor Manufacturing，5(2)，156-158。  new window
4.簡禎富、林鼎浩、劉巧雯、彭誠湧、徐紹鐘、黃佳琪(20020300)。建構晶圓圖分類之資料挖礦方法及其實證研究。工業工程學刊，19(2)，23-38。new window  延伸查詢new window
5.簡禎富、李培瑞、彭誠湧(20030700)。半導體製程資料特徵萃取與資料挖礦之研究。資訊管理學報，10(1)，63-84。new window  延伸查詢new window
6.簡禎富、林鼎浩、彭誠湧、徐紹鐘(20010700)。建構半導體晶圓允收測試資料挖礦架構及其實證研究。工業工程學刊，18(4)，37-47。new window  延伸查詢new window
7.Uzsoy, R.、Lee, C. Y.、Martin-Vega, L. A.(1994)。A Review of Production Planning and Scheduling Models in the Semiconductor Industry Part II: Shop-Floor Control。IIE Transactions，26(5)，44-55。  new window
8.Leachman, R. C.、Hodges, D. A.(1996)。Benchmarking semiconductor manufacturing。IEEE Transactions on Semiconductor Manufacturing，9(2)，158-169。  new window
9.Uzsoy, R.、Lee, Chung-Yee、Martin-vega, L. A.(1992)。A Review of Production Planning and Scheduling Model in the Semiconductor Industry Part I: System Characteristics, Performance Evaluation and Production Planning。IIE Transactions，16(4)，47-60。  new window
10.彭誠湧、簡禎富(2003)。Data Value Development to Enhance Competitive Advantage: A Retrospective Study of EDA Systems for Semiconductor Fabrication。International Journal of Services Technology and Management，4(4-6)，365-383。  new window
11.Quinlan, J. R.(1986)。Introduction to decision trees。Machine Learning，1(1)，81-106。  new window
12.簡禎富、劉志明、溫于平、薛家豪(2000)。捷運機廠電聯車維修績效指標建立之研究。捷運技術，22，71-78。new window  延伸查詢new window
13.Cunningham, S. P.、Shanthikumar, J. G.(1996)。Empirical results on the relationship between die yield and cycle time in semiconductor wafer fabrication。IEEE Transactions on Semiconductor Manufacturing，9，273-277。  new window
14.Leachman, R.(1997)。Closed-loop measurement of equipment efficiency and equipment capacity。IEEE Transactions on Semiconductor Manufacturing，10(1)，84-97。  new window
15.Lee, Y.、Kim, S.、Yea, S.、Kim, B.(1994)。Production Planning in Semiconductor Wafer Fab Considering Variable Cycle Time。Computers & Industrial Engineering，33，713-716。  new window
16.Lynes, K.、Miltenburg, J.(1994)。The application of an open queuing network to the analysis of cycle time, variability, throughput, inventory and cost in the batch production system of a microelectronics manufacturer。International Journal of Production Economics，37，189-203。  new window
17.Nemoto, K.、Akcali, E.、Uzsoy, R. M.(2000)。Quantifying the benefits of cycle time reduction in semiconductor wafer fabrication。IEEE Transactions on Electronics Packaging Manufacturing，23，39-47。  new window
18.Srivastava, A. N.(1999)。Data mining for semiconductor yield forecasting。Future Fab International，7，67-70。  new window
會議論文
1.Fridgeirsdottir, K.、Akella, R.、Li, M.、McNally, P.、Mittal, S.(1998)。Statistical methodology for yield enhancement via baseline reduction77-80。  new window
2.Gardner, M.、Bieker, J.(2000)。Data mining solves tough semiconductor manufacturing problems376-383。  new window
3.Arora, G.、Dabbas, R.、Chen, H. N.(1997)。Statistical analysis of manufacturing line data in a semiconductor fabrication facility。Tempe, AZ。10-12。  new window
4.Koppenhoefer, B.、Wuerthner, S.、Ludwig, L.、Rosenstiel, W.、Kuge, H.、Hummel, M.、Federl, P.(1997)。Analysis of electrical test data using a neural network approach。沒有紀錄。37-41。  new window
5.Mieno, F.、Sato, T.、Shibuya, Y.、Odagiri, K.、Tsuda, H.、Take, R.(1999)。Yield improvement using data mining system, semiconductor manufacturing conference proceedings。沒有紀錄。391-394。  new window
圖書
1.Clemen, R. T.(1996)。Making hard decisions。Belmont, CA：Duxbury Press。  new window
2.Kohonen, T.(1997)。Self-Organizing Map。Berlin：Springer-Verlag。  new window
3.Breiman, L.、Friedman, J. H.、Olshen, R. A.、Stone, C. J.(1984)。Classification and Regression Trees。Chapman & Hall/CRC。  new window
4.Keeney, Ralph L.、Raiffa, Howard(1993)。Decisions with Multiple Objectives: Preferences and Value Tradeoffs。Cambridge University Press。  new window
5.Berry, Michael J. A.、Linoff, Gordon S.(1997)。Data Mining Techniques for Marketing, Sales and Customer Support。John Wiley & Sons, Inc.。  new window
6.Czitrom, V.、Spagon, P. D.(1997)。Statistical Case Studies for Industrial Process Improvement。Statistical Case Studies for Industrial Process Improvement。沒有紀錄。  new window
 
 
 
 
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