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題名:MSPRT在精熟測驗上的應用--以2005年國中基本學力測驗數學科為例
書刊名:測驗學刊
作者:盧宏益
作者(外文):Lu, Hung-yi
出版日期:2010
卷期:57:1
頁次:頁85-105
主題關鍵詞:修正遂次機率比檢定國中基本學力測驗遂次機率比檢定精熟測驗Basic competence test for junior high school studentsMastery testModified sequential probability ratio testSequential probability ratio test
原始連結:連回原系統網址new window
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  • 被引用次數被引用次數:期刊(0) 博士論文(0) 專書(0) 專書論文(0)
  • 排除自我引用排除自我引用:0
  • 共同引用共同引用:17
  • 點閱點閱:52
期刊論文
1.鄭明長、余民寧(199401)。各種通過分數設定方法之比較。測驗年刊,41,19-40。new window  延伸查詢new window
2.Chang, Y.-C. I.(2004)。Application of sequential probability ratio test to computerized criterion-referenced testing。Sequential Analysis,23(1),45-61。  new window
3.Spray, Judith A.、Reckase, Mark D.(1996)。Comparison of SPRT and Sequential Bayes Procedures for Classifying Examinees into Two Categories Using a Computerized Test。Journal of Educational and Behavioral Statistics,21(4),405-414。  new window
4.Glaser, R.(1963)。Instructional Technology and the Measurement of Learning Outcomes: Some Questions。American Psychologist,18(8),519-521。  new window
5.Guion, R. M.、Ironson, G. H.(1983)。Latent Trait Theory for Organizational Research。Organizational Behavior and Human Performance,31,54-87。  new window
6.余民寧(19940200)。試題反應理論的介紹(14)--精熟測驗。研習資訊,11(1),7-11。  延伸查詢new window
7.Wright, Benjamin D.(1977)。Solving Measurement Problems with the Rasch Model。Journal of Educational Measurement,14(2),97-116。  new window
8.謝進昌(20060300)。精熟標準設定方法的歷史演進與詮釋的新概念。國民教育研究學報,16,157-193。new window  延伸查詢new window
9.Chang, Y.-C. I.,、Ying, Z.(2004)。Sequential estimation in variable length computerized adaptive testing。Journal of Statistical Planning and Inference,121(2),249-264。  new window
10.Lord, F. M.(1971)。A theoretical study of two-stage testing。Psychometrika,36,227-242。  new window
研究報告
1.Spray, J.(1993)。Multiple-category classification using a sequential probability ratio test。Iowa City, IA。  new window
學位論文
1.Ivens, S. H.(1970)。An investigation of item analysis, reliability and validity in relation to criterion-referenced tests,Tallahassee, FL.。  new window
圖書
1.Birnbaum, A.(1968)。Some latent trait models and their user in inferring an examinee’s ability。Statistical theories of mental rest scores。Reading, MA:Addison-Wesley。  new window
2.Wald, A.(1947)。Sequential Analysis。John Wiley & Sons, Inc.。  new window
3.Lord, Frederic M.、Novick, Melvin R.、Birnbaum, Allan(1968)。Statistical Theories of Mental Test Scores。Addison-Wesley Publishing Company。  new window
4.Wainer, H.(2000)。Computerized adaptive testing: A primer。Mahwah, NJ:Erlbaum。  new window
5.Rasch, G.(1960)。Probabilistic models for some intelligence and attainment tests。Copenhagen:The Danish Institute of Educational Research。  new window
6.余民寧(1997)。教育測驗與評量:成就測驗與教學評量。臺北:心理。  延伸查詢new window
7.Siegmund, David(1985)。Sequential analysis: Tests and confidence intervals。Springer-Verlag。  new window
8.Lazarsfeld, P. F.、Henry, N. W.(1968)。Latent Structure Analysis。Houghton Mifflin Company。  new window
9.Hambleton, R. K.、Swaminathan, H.(1985)。Item Response Theory: Principles and Applications。Boston, Massachusetts:Kluwer-Nijhoff。  new window
10.Fu, K. C.(1968)。Sequential methods in pattern recognition and machine learning。NewYork。  new window
11.Kingsbury, G. G.,、Weiss, D. J.(1983)。A comparison of IRT-Based adaptive mastery and a sequential mastery testing procedure。New horizons in testing: Latent trait test theory and computerized adaptive testing。New York。  new window
12.Lord, F. M.(1952)。A theory of test scores。Psychometric Monograph。  new window
13.Reckase, M. D.(1983)。A procedure for decision making using tailored testing。New horizons in testing: Latent trait test theory and computerized adaptive testing。New York。  new window
 
 
 
 
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