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題名:建構半導體廠跨廠績效評估以提昇資源分配決策品質之研究
書刊名:品質學報
作者:周明璇陳文智簡禎富
作者(外文):Chou, Ming-hsuanChen, Wen-chihChien, Chen-fu
出版日期:2013
卷期:20:4
頁次:頁427-444
主題關鍵詞:跨廠績效評估資料包絡分析決策品質半導體製造全面資源管理Inter-fab performance evaluationData envelopment analysisDecision qualitySemiconductor manufacturingTotal resource management
原始連結:連回原系統網址new window
相關次數:
  • 被引用次數被引用次數:期刊(4) 博士論文(0) 專書(1) 專書論文(0)
  • 排除自我引用排除自我引用:4
  • 共同引用共同引用:274
  • 點閱點閱:68
半導體製造為資本密集且高度競爭的高科技產業,為了維持競爭優勢,如何提升生產力以更有效地運用各種投入資源成為各企業重要的課題。本研究以紫式決策分析架構和資料包絡分析法為基礎,建立半導體跨廠績效評估模式,使用多項製造指標以衡量各廠之相對效率,並以臺灣某半導體公司之晶圓廠為實證以檢驗效度,並結合領域專家的知識,給予各項指標改善的方向與建議,以提昇跨廠資源分配的決策品質。本研究以實例說明生產規模與生產績效之間的變化趨勢,分析各廠所面臨的優勢與弱勢指標,研究發現藉由企業內部廠際間的評比,可以幫助管理者瞭解各個決策單位執行狀況,並作適當地資源配置,設定改善的方向與幅度,實證研究已驗證本研究之效度與可行性。
Semiconductor manufacturing is very capital intensive and competitive. It is important to optimize the utilization of various resources to generate the outputs efficiently for maintaining competitive advantages. This research aims to conduct data envelopment analysis based on UNISON framework for inter-fab performance evaluation with multiple indices from the constructed objective hierarchy. An empirical study was conducted with real data collected from a leading Taiwan semiconductor company to estimate the validity of the proposed approach. The results can support the decision maker to determine the improvement directions for appropriate resource allocations and thus demonstrate the practical viability of the proposed approach.
期刊論文
1.Kozmetsky, G.、Yue, P. O.(1998)。Comparative Performance of Global Semiconductor Companies。Omega,26(2),153-175。  new window
2.Chu, Mei-tai、Shyu, Joesph Z.、Khosla, R.(2008)。Measuring the Relative Performance for Leading Fabless Firms by Using Data Envelopment Analysis。Journal of Intellect Manufacturing,19(3),257-272。  new window
3.簡禎富、胡志翰(20111200)。全面資源管理架構:以晶圓廠為實證。品質學報,18(6),581-607。new window  延伸查詢new window
4.Chen, Wen-Chih、Chien, Chen-Fu(2011)。Measuring relative performance of wafer fabrication operations: a case study。Journal of Intelligent Manufacturing,22(3),447-457。  new window
5.Chien, C.-F.、Chen, W.-C.、Hsu, S.-C.(2010)。Requirement estimation for indirect workforce allocation in semiconductor manufacturing。International Journal of Production Research,48(23),6959-6976。  new window
6.Chien, C.-F.、Chen, W.-C.、Lo, F.-Y.、Lin, Y.-C.(2007)。A case study to evaluate the productivity changes of the thermal power plants of the Taiwan power company。IEEE Transactions on Energy Conversion,22(3),680-688。  new window
7.Färe, R.、Grosskopf, S.、Valdmanis, V.(1989)。Capacity, competition, and efficiency in hospitals: a nonparametric approach。Journal of Productivity Analysis,1(2),123-138。  new window
8.Leachman, R. C.、Ding, S.、Chien, C.-F.(2007)。Economic efficiency analysis of wafer fabrication。IEEE Transactions on Automation Science and Engineering,4(4),501-512。  new window
9.Leachman, R. C.、Hodges, D.(1996)。Benchmarking semiconductor manufacturing。IEEE Transactions on Semiconductor Manufacturing,9(2),158-169。  new window
10.Chien, C.-F.、Wang, H.-J.、Wang, M.(2007)。A UNISON Framework for Analyzing Alternative Strategies of IC Final Testing for Enhancing Overall Operational Effectiveness。International Journal of Production Economics,107(1),20-30。  new window
11.Färe, R.、Grosskopf, S.、Lindgren, B.、Roos, P.(1992)。Productivity Changes in Swedish Pharmacies 1980-1989: A Non-Parametiric Malmquist Approach。Journal of Productivity Analysis,3(1/2),85-101。  new window
12.Seiford, Lawrence M.、Zhu, Joe(1999)。Profitability and marketability of the top 55 U.S. commercial banks。Management Science,45(9),1270-1288。  new window
13.簡禎富、游智閔、徐紹鐘(20090400)。紫式決策分析以建構半導體晶圓廠人力規劃決策模型。管理與系統,16(2),157-180。new window  延伸查詢new window
14.Wu, Jei-Zheng、Chien, Chen-Fu(2008)。Modeling Strategic Semiconductor Assembly Outsourcing Decisions Based on Empirical Settings。OR Spectrum,30(3),401-430。  new window
15.Liu, Fuh-Hwa Franklin、Wang, Peng-Hsiang(2008)。DEA Malmquist productivity measure: Taiwanese semiconductor companies。International Journal Production Economics,112(1),367-379。  new window
16.Chien, C.-F.、Hsu, C. Y.(2011)。UNISON analysis to model and reduce step-and-scan overlay errors for semiconductor manufacturing。Journal of Intelligent Manufacturing,22(3),399-412。  new window
17.Banker, Rajiv D.、Charnes, Abraham、Cooper, William Wager(1984)。Some Models for Estimating Technical and Scale Inefficiencies in Data Envelopment Analysis。Management Science,30(9),1078-1092。  new window
18.Golany, Boaz、Roll, Yaakov(1989)。An application procedure for DEA。OMEGA: International Journal of Management Science,17(3),237-250。  new window
19.簡禎富、陳勁甫、陳建宏(20090400)。Designing Performance Indices and a Novel Mechanism for Evaluating Government R&D Projects。品質學報,16(2),119-135。new window  new window
20.Caves, Douglas W.、Christensen, Laurits R.、Diewert, W. Erwin(1982)。The Economic Theory of Index Numbers and the Measurement of Input, Output, and Productivity。Econometrica: Journal of the Econometric Society,50(6),1393-1414。  new window
21.吳吉政、許嘉裕(20090400)。Critical Success Factors for Improving Decision Quality on Collaborative Design in the IC Supply Chain。品質學報,16(2),95-108。new window  new window
22.Farrell, Michael James(1957)。The Measurement of Productive Efficiency。Journal of the Royal Statistical Society: Series A (General),120(3),253-290。  new window
23.Charnes, Abraham、Cooper, William W.、Rhodes, Edwardo(1978)。Measuring the efficiency of decision making units。European Journal of Operational Research,2(6),429-444。  new window
會議論文
1.Carbone, T. A.(2002)。Measuring efficiency of semiconductor manufacturing operations using data envelopment analysis (DEA)。The 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference,56-62。  new window
圖書
1.Cooper, W. W.、Seiford, L. M.、Zhu, J.(2011)。Handbook on Data Envelopment Analysis。New York。  new window
2.簡禎富(2005)。決策分析與管理:全面決策品質提升之架構與方法。雙葉書廊。new window  延伸查詢new window
3.高強、黃旭男、末吉俊幸(2003)。管理績效評估:資料包絡分析法。臺北:華泰文化。new window  延伸查詢new window
 
 
 
 
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